<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     caa a22        4500</leader>
  <controlfield tag="001">467921369</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180406152918.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">170328e20060601xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/s10836-006-8600-0</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/s10836-006-8600-0</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="2">
   <subfield code="a">A Low-Cost Jitter Measurement Technique for BIST Applications</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[Jiun-Lang Huang, Jui-Jer Huang, Yuan-Shuang Liu]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">In this paper, we present a BIST technique that measures the RMS value of a Gaussian distribution period jitter. In the proposed approach, the signal under test is delayed by two different delay values and the probabilities it leads the two delayed signals are measured. The RMS jitter can then be derived from the probabilities and the delay values. Behavior and circuit simulations are performed to validate the proposed technique and analyze the design tradeoffs, and preliminary measurement results on FPGA are also presented.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">Springer Science + Business Media, LLC, 2006</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">random jitter</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">built-in self-test</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">jitter measurement</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Huang</subfield>
   <subfield code="D">Jiun-Lang</subfield>
   <subfield code="u">Graduate Institute of Electronics Engineering and Department of Electrical Engineering, National Taiwan University, Taiwan, R.O.C.</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Huang</subfield>
   <subfield code="D">Jui-Jer</subfield>
   <subfield code="u">Graduate Institute of Electronics Engineering and Department of Electrical Engineering, National Taiwan University, Taiwan, R.O.C.</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Liu</subfield>
   <subfield code="D">Yuan-Shuang</subfield>
   <subfield code="u">VIA Networking Technologies, Inc., Taipei, Taiwan, R.O.C.</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">Journal of Electronic Testing</subfield>
   <subfield code="d">Kluwer Academic Publishers</subfield>
   <subfield code="g">22/3(2006-06-01), 219-228</subfield>
   <subfield code="x">0923-8174</subfield>
   <subfield code="q">22:3&lt;219</subfield>
   <subfield code="1">2006</subfield>
   <subfield code="2">22</subfield>
   <subfield code="o">10836</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/s10836-006-8600-0</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/s10836-006-8600-0</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Huang</subfield>
   <subfield code="D">Jiun-Lang</subfield>
   <subfield code="u">Graduate Institute of Electronics Engineering and Department of Electrical Engineering, National Taiwan University, Taiwan, R.O.C</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Huang</subfield>
   <subfield code="D">Jui-Jer</subfield>
   <subfield code="u">Graduate Institute of Electronics Engineering and Department of Electrical Engineering, National Taiwan University, Taiwan, R.O.C</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Liu</subfield>
   <subfield code="D">Yuan-Shuang</subfield>
   <subfield code="u">VIA Networking Technologies, Inc., Taipei, Taiwan, R.O.C</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">Journal of Electronic Testing</subfield>
   <subfield code="d">Kluwer Academic Publishers</subfield>
   <subfield code="g">22/3(2006-06-01), 219-228</subfield>
   <subfield code="x">0923-8174</subfield>
   <subfield code="q">22:3&lt;219</subfield>
   <subfield code="1">2006</subfield>
   <subfield code="2">22</subfield>
   <subfield code="o">10836</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
