caa a22 4500 467921377 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20060601xx s 000 0 eng 10.1007/s10836-006-9319-7 doi (NATIONALLICENCE)springer-10.1007/s10836-006-9319-7 An Automated BIST Architecture for Testing and Diagnosing FPGA Interconnect Faults [Elektronische Daten] [Jack Smith, Tian Xia, Charles Stroud] We present an efficient built-in self-test (BIST) architecture for testing and diagnosing stuck-at faults, delay faults, and bridging faults in FPGA interconnect resources. The BIST structure contains self-enabling test pattern generators, self-configurable switch matrices, and response analyzers that all work together and reprogram themselves without any external intervention. This eliminates downloading configuration bitstreams into the FPGA after the start of testing and, hence, reduces test time. Our technique requires only six different switch matrix configurations to test the interconnect, which is fewer than prior methods, while retaining good diagnostic resolution. The area overhead to add self-configurable test structures to Xilinx FPGAs is as low as 0.5%. Springer Science + Business Media, LLC, 2006 stuck-at faults nationallicence delay faults nationallicence bridging faults nationallicence Smith Jack IBM Corporation, 05452, Burlington, VT, USA aut Xia Tian Electrical Engineering Department, University of Vermont, 05452, Burlington, VT, USA aut Stroud Charles Electrical & Computer Engr, Auburn University, 36849, Auburn, AL, USA aut Journal of Electronic Testing Kluwer Academic Publishers 22/3(2006-06-01), 239-253 0923-8174 22:3<239 2006 22 10836 https://doi.org/10.1007/s10836-006-9319-7 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9319-7 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Smith Jack IBM Corporation, 05452, Burlington, VT, USA aut NATIONALLICENCE 700 1- Xia Tian Electrical Engineering Department, University of Vermont, 05452, Burlington, VT, USA aut NATIONALLICENCE 700 1- Stroud Charles Electrical & Computer Engr, Auburn University, 36849, Auburn, AL, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/3(2006-06-01), 239-253 0923-8174 22:3<239 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer