naa a22 4500 467921423 CHVBK 20170328050057.0 cr unu---uuuuu 170328e20060601xx s 000 0 eng 10.1007/s10836-006-9390-0 doi (NATIONALLICENCE)springer-10.1007/s10836-006-9390-0 Test Technology Newsletter [Elektronische Daten] June 2006 The Newsletter of the Test Technology Technical Council of the IEEE Computer Society Editor: Bruce Kim Springer Science + Business Media, LLC, 2006 Journal of Electronic Testing Kluwer Academic Publishers 22/3(2006-06-01), 217-218 0923-8174 22:3<217 2006 22 10836 https://doi.org/10.1007/s10836-006-9390-0 text/html Onlinezugriff via DOI 1 editorial jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9390-0 text/html Onlinezugriff via DOI NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/3(2006-06-01), 217-218 0923-8174 22:3<217 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence SWISSBIB 462691721 BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer