caa a22 4500 467921431 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20060601xx s 000 0 eng 10.1007/s10836-006-7761-1 doi (NATIONALLICENCE)springer-10.1007/s10836-006-7761-1 ADOFs and Resistive-ADOFs in SRAM Address Decoders: Test Conditions and March Solutions [Elektronische Daten] [Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Simone Borri, Magali Hage-Hassan] This paper presents a comparative analysis of ADOFs (Address Decoder Open Faults) and resistive-ADOFs in embedded-SRAMs. Such faults are the primary target of this study because they are hard-to-detect faults. These faults are caused by some particular defects which may appear in the parallel transistor network of the logic gates in the address decoders. With this study, we show that the test conditions required for ADOFs testing (sensitization and observation) are also useful for resistive-ADOFs detection, but more stringent timing requirements are needed. In the last part of the paper, we propose a study on the conditions to detect ADOFs with March tests. Moreover, we propose new March elements, which are effective for ADOF testing, and which can be added to existing March tests. Springer Science + Business Media, LLC, 2006 memory testing nationallicence dynamic faults nationallicence address decoders nationallicence Dilillo Luigi Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Université de Montpellier II/CNRS 161, rue Ada—34392, Montpellier Cedex 5, France aut Girard Patrick Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Université de Montpellier II/CNRS 161, rue Ada—34392, Montpellier Cedex 5, France aut Pravossoudovitch Serge Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Université de Montpellier II/CNRS 161, rue Ada—34392, Montpellier Cedex 5, France aut Virazel Arnaud Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Université de Montpellier II/CNRS 161, rue Ada—34392, Montpellier Cedex 5, France aut Borri Simone Infineon Technologies France, Route des Crêtes—06560, 2600, Sophia-Antipolis, France aut Hage-Hassan Magali Infineon Technologies France, Route des Crêtes—06560, 2600, Sophia-Antipolis, France aut Journal of Electronic Testing Kluwer Academic Publishers 22/3(2006-06-01), 287-296 0923-8174 22:3<287 2006 22 10836 https://doi.org/10.1007/s10836-006-7761-1 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-7761-1 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Dilillo Luigi Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Université de Montpellier II/CNRS 161, rue Ada—34392, Montpellier Cedex 5, France aut NATIONALLICENCE 700 1- Girard Patrick Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Université de Montpellier II/CNRS 161, rue Ada—34392, Montpellier Cedex 5, France aut NATIONALLICENCE 700 1- Pravossoudovitch Serge Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Université de Montpellier II/CNRS 161, rue Ada—34392, Montpellier Cedex 5, France aut NATIONALLICENCE 700 1- Virazel Arnaud Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier, Université de Montpellier II/CNRS 161, rue Ada—34392, Montpellier Cedex 5, France aut NATIONALLICENCE 700 1- Borri Simone Infineon Technologies France, Route des Crêtes—06560, 2600, Sophia-Antipolis, France aut NATIONALLICENCE 700 1- Hage-Hassan Magali Infineon Technologies France, Route des Crêtes—06560, 2600, Sophia-Antipolis, France aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/3(2006-06-01), 287-296 0923-8174 22:3<287 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer