caa a22 4500 46792144X CHVBK 20180406152918.0 cr unu---uuuuu 170328e20060601xx s 000 0 eng 10.1007/s10836-006-8634-3 doi (NATIONALLICENCE)springer-10.1007/s10836-006-8634-3 Observability Statement Coverage Based on Dynamic Factored Use-Definition Chains for Functional Verification [Elektronische Daten] [Tao Lv, Jian-Ping Fan, Xiao-Wei Li, Ling-Yi Liu] Simulation is still the primary verification method for integrated circuit designs, and coverage evaluation is indispensable for it on account of its incompleteness. As the functional complexity of modern designs is increasing dramatically, it is necessary to take observability into consideration for coverage metrics. In this paper we extend factored use-definition chains (FUD chains), a mature data structure in compilers, from sequential software to concurrent hardware design, and propose dynamic FUD chains (DFUD chains). Based on it, we present an observability model and an algorithm to evaluate observability-based statement coverage. This technique has several advantages. Firstly, it could be easily integrated into compilers or simulators for hardware description languages, since it utilizes many flow analysis techniques adopted in compilers. Secondly, it can be combined with many controllability metrics, such as statement coverage metric, since the observability model is based on definitions and uses of variables. The proposed technique has been implemented as a prototype tool for Verilog designs, and experimental results show its benefits. Springer Science + Business Media, LLC, 2006 design verification nationallicence coverage metrics nationallicence observability nationallicence dynamic factored use-definition chains nationallicence data-flow analysis nationallicence Lv Tao Advanced Test Technology Laboratory, Key Laboratory of Computer System and Architecture, Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), Beijing, China aut Fan Jian-Ping Advanced Test Technology Laboratory, Key Laboratory of Computer System and Architecture, Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), Beijing, China aut Li Xiao-Wei Advanced Test Technology Laboratory, Key Laboratory of Computer System and Architecture, Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), Beijing, China aut Liu Ling-Yi Advanced Test Technology Laboratory, Key Laboratory of Computer System and Architecture, Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), Beijing, China aut Journal of Electronic Testing Kluwer Academic Publishers 22/3(2006-06-01), 273-285 0923-8174 22:3<273 2006 22 10836 https://doi.org/10.1007/s10836-006-8634-3 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-8634-3 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Lv Tao Advanced Test Technology Laboratory, Key Laboratory of Computer System and Architecture, Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), Beijing, China aut NATIONALLICENCE 700 1- Fan Jian-Ping Advanced Test Technology Laboratory, Key Laboratory of Computer System and Architecture, Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), Beijing, China aut NATIONALLICENCE 700 1- Li Xiao-Wei Advanced Test Technology Laboratory, Key Laboratory of Computer System and Architecture, Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), Beijing, China aut NATIONALLICENCE 700 1- Liu Ling-Yi Advanced Test Technology Laboratory, Key Laboratory of Computer System and Architecture, Institute of Computing Technology (ICT), Chinese Academy of Sciences (CAS), Beijing, China aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/3(2006-06-01), 273-285 0923-8174 22:3<273 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer