caa a22 4500 467921466 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9498-2 doi (NATIONALLICENCE)springer-10.1007/s10836-006-9498-2 Lifetime Prediction and Design-for-Reliability of IC Interconnections with Electromigration Induced Degradation in the Presence of Manufacturing Defects [Elektronische Daten] [Xiangdong Xuan, Adit Singh, Abhijit Chatterjee] The degradation of IC interconnects due to electromigration (EM) is strongly influenced by physical defects and imperfections on interconnect traces that significantly accelerate EM damage through increased current density and elevated temperature. In this work, an IC reliability simulator is developed to incorporate the effect of these physical defects on circuit interconnect reliability. Based on a statistical defect modeling approach, circuit-level reliability with defective interconnects under EM degradation is evaluated. This has also been successfully integrated into a tool called ARET. Additionally, an approach for identifying circuit reliability hotspots has also been developed. Based on this hotspot identification, the concept of local design-for-reliability (LDFR) is proposed for improved circuit-level reliability under electromigration. Springer Science + Business Media, LLC, 2006 IC reliability nationallicence interconnect nationallicence reliability simulation nationallicence design for reliability nationallicence defect modeling nationallicence electromigration nationallicence Xuan Xiangdong School of ECE, Georgia Institute of Technology, 30332, Atlanta, GA, USA aut Singh Adit Department of ECE, Auburn University, 36849, Auburn, AL, USA aut Chatterjee Abhijit School of ECE, Georgia Institute of Technology, 30332, Atlanta, GA, USA aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 471-482 0923-8174 22:4-6<471 2006 22 10836 https://doi.org/10.1007/s10836-006-9498-2 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9498-2 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Xuan Xiangdong School of ECE, Georgia Institute of Technology, 30332, Atlanta, GA, USA aut NATIONALLICENCE 700 1- Singh Adit Department of ECE, Auburn University, 36849, Auburn, AL, USA aut NATIONALLICENCE 700 1- Chatterjee Abhijit School of ECE, Georgia Institute of Technology, 30332, Atlanta, GA, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 471-482 0923-8174 22:4-6<471 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer