caa a22 4500 467921474 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9500-z doi (NATIONALLICENCE)springer-10.1007/s10836-006-9500-z A BIST Scheme for SNDR Testing of ΣΔ ADCs Using Sine-Wave Fitting [Elektronische Daten] [Luis Rolíndez, Salvador Mir, Ahcéne Bounceur, Jean-Louis Carbonéro] Sigma-Delta (ΣΔ) modulators have made possible the design of high-resolution Analogue-to-Digital Converters (ADCs) with relaxed analogue circuitry precision by moving most of the design complexity to the digital domain. However, testing these ΣΔ ADCs is becoming a costly task due to trends towards high-resolution implementations and associated increase in samples required to extract key specifications. In this paper, we propose a Built-In Self-Test (BIST) technique for high-resolution ΣΔ ADCs. The technique, mostly digital, moves most of the test complexity to the digital domain, that is in-line with the philosophy of ΣΔ modulation. Both the test signal generation and the output response analysis are performed on-chip. The stimulus, a sinusoid encoded in a binary bit stream, is chosen to have very high quality in the bandwidth of the converter with the quantization error laying outside of the analogue modulator's bandwidth. For the output response analysis, a sine-wave fitting algorithm is implemented on chip. For this, a digital sinusoidal stimulus of a very high precision is needed as a reference signal. In this paper, we generate this reference signal from the same input stimulus, by passing it through the digital filter already existing in the converter. Simulations results show the capability of this technique to obtain measurements of the SNDR (Signal-to-Noise-plus-Distortion Ratio) for a 16-bit audio ΣΔ ADC. Springer Science + Business Media, Inc., 2006 analogue BIST nationallicence analogue-to-digital converter nationallicence mixed-signal testing nationallicence sigma-delta modulation nationallicence Rolíndez Luis TIMA Laboratory, 46 Avenue Félix Viallet, 38031, Grenoble, France aut Mir Salvador TIMA Laboratory, 46 Avenue Félix Viallet, 38031, Grenoble, France aut Bounceur Ahcéne TIMA Laboratory, 46 Avenue Félix Viallet, 38031, Grenoble, France aut Carbonéro Jean-Louis STMicroelectronics, 850 rue Jean Monnet, 38926, Crolles, France aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 325-335 0923-8174 22:4-6<325 2006 22 10836 https://doi.org/10.1007/s10836-006-9500-z text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9500-z text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Rolíndez Luis TIMA Laboratory, 46 Avenue Félix Viallet, 38031, Grenoble, France aut NATIONALLICENCE 700 1- Mir Salvador TIMA Laboratory, 46 Avenue Félix Viallet, 38031, Grenoble, France aut NATIONALLICENCE 700 1- Bounceur Ahcéne TIMA Laboratory, 46 Avenue Félix Viallet, 38031, Grenoble, France aut NATIONALLICENCE 700 1- Carbonéro Jean-Louis STMicroelectronics, 850 rue Jean Monnet, 38926, Crolles, France aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 325-335 0923-8174 22:4-6<325 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer