caa a22 4500 467921482 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9456-z doi (NATIONALLICENCE)springer-10.1007/s10836-006-9456-z Miura Yukiya Graduate School of Engineering, Tokyo Metropolitan University, 1-1 Minami-Osawa, 192-0397, Hachioji, Tokyo, Japan aut Proposal of Fault Diagnosis of Analog Circuits by Combining Operation-Region Model and X - Y Zoning Method: Case Study [Elektronische Daten] [Yukiya Miura] We propose a method of diagnosing analog circuits that is achieved by combining an operation-region model and an X-Y zoning method. The X-Y zoning method can be used to detect faults in analog circuits by using the relationship between circuit inputs and outputs. The operation-region model can be used to analyze/model circuit behaviors by utilizing changes in the operation regions of MOS transistors in a circuit. Operation regions are obtained from transistor node voltages at sampling time corresponding to a particular excitation of the input value and the corresponding output value. Since we developed a data processing method to handle data discretely, we could implement a procedure for diagnosis based on the preset test, which is a method of diagnosing digital circuits. We demonstrated the effectiveness of our method by applying it to ITC'97 benchmark circuits with hard and soft faults. We found that the diagnostic resolution is one for every fault. Springer Science + Business Media, LLC, 2006 analog circuits nationallicence fault diagnosis nationallicence MOS transistors nationallicence operation-region model nationallicence X - Y zoning method nationallicence Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 411-423 0923-8174 22:4-6<411 2006 22 10836 https://doi.org/10.1007/s10836-006-9456-z text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9456-z text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Miura Yukiya Graduate School of Engineering, Tokyo Metropolitan University, 1-1 Minami-Osawa, 192-0397, Hachioji, Tokyo, Japan aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 411-423 0923-8174 22:4-6<411 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer