caa a22 4500 467921490 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9457-y doi (NATIONALLICENCE)springer-10.1007/s10836-006-9457-y Test Development Through Defect and Test Escape Level Estimation for Data Converters [Elektronische Daten] [Carsten Wegener, Michael Kennedy] Testing integrated circuits (ICs) is understood as the task of filtering out defective ICs that violate data sheet specifications. The costs of this filter comprise both the direct cost of testing a device and the indirect cost of test escapes and test yield-loss. For analog and mixed-signal devices, such as data converters, traditional methods of estimating the defect and test escape levels require large sample sets of devices. This is because the defect level induced by manufacturing process variations is typically low. In this work, a model-based method of estimating defect and test escape levels is described. For this method, a small set of sample devices is sufficient, as we first derive a manufacturing process model which is then used to simulate the manufacturing of a large number of devices. These simulation results are subsequently used for the purposes of estimating the defect and test escape levels, as well as the test-related yield-loss when applying a given test. With these estimates, the quality and indirect costs of a test can be determined as a function of the test limits and guard-bands applied in production test. Springer Science + Business Media, LLC, 2006 mixed-signal and analog test nationallicence economics of test nationallicence test and post-test data analysis nationallicence Wegener Carsten Department of Microelectronic Engineering, University College Cork, Cork, Ireland aut Kennedy Michael Department of Microelectronic Engineering, University College Cork, Cork, Ireland aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 313-324 0923-8174 22:4-6<313 2006 22 10836 https://doi.org/10.1007/s10836-006-9457-y text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9457-y text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Wegener Carsten Department of Microelectronic Engineering, University College Cork, Cork, Ireland aut NATIONALLICENCE 700 1- Kennedy Michael Department of Microelectronic Engineering, University College Cork, Cork, Ireland aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 313-324 0923-8174 22:4-6<313 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer