caa a22 4500 467921520 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9503-9 doi (NATIONALLICENCE)springer-10.1007/s10836-006-9503-9 A 1-MHz Area-Efficient On-Chip Spectrum Analyzer for Analog Testing [Elektronische Daten] [M. Domínguez, J. Ausín, J. Duque-Carrillo, G. Torelli] This paper presents a 0.35-μm CMOS on-chip spectrum analyzer based on switched-capacitor (SC) techniques. The prototype device utilizes a 3-V supply and basically includes an SC sine-wave generator, a fourth-order high-selectivity SC filter, and a programmable gain amplifier followed by an 8-b analog-to-digital converter. A non-uniform sampling scheme, which adds one degree of freedom in determining the frequency response parameters of SC circuits, helps to obtain high programmability resolution without modifying any capacitor value. As a result, capacitor spread and total capacitor area are reduced as compared to traditional SC solutions and, hence, test area overhead is minimized. Experimental results demonstrate the effectiveness of the proposed approach to perform frequency response and total harmonic distortion measurements for frequencies up to 1MHz. Springer Science + Business Media, LLC, 2006 analog built-in self-test nationallicence analog IC test nationallicence on-chip spectrum analyzer nationallicence switched-capacitor circuits nationallicence non-uniform sampling nationallicence Domínguez M. Department of Electronic and Electrical Engineering, University of Extremadura, 06071, Badajoz, Spain aut Ausín J. Department of Electronic and Electrical Engineering, University of Extremadura, 06071, Badajoz, Spain aut Duque-Carrillo J. Department of Electronic and Electrical Engineering, University of Extremadura, 06071, Badajoz, Spain aut Torelli G. Department of Electronics, University of Pavia, Via Ferrata 1, I-27100, Pavia, Italy aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 437-448 0923-8174 22:4-6<437 2006 22 10836 https://doi.org/10.1007/s10836-006-9503-9 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9503-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Domínguez M. Department of Electronic and Electrical Engineering, University of Extremadura, 06071, Badajoz, Spain aut NATIONALLICENCE 700 1- Ausín J. Department of Electronic and Electrical Engineering, University of Extremadura, 06071, Badajoz, Spain aut NATIONALLICENCE 700 1- Duque-Carrillo J. Department of Electronic and Electrical Engineering, University of Extremadura, 06071, Badajoz, Spain aut NATIONALLICENCE 700 1- Torelli G. Department of Electronics, University of Pavia, Via Ferrata 1, I-27100, Pavia, Italy aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 437-448 0923-8174 22:4-6<437 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer