caa a22 4500 467921539 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9458-x doi (NATIONALLICENCE)springer-10.1007/s10836-006-9458-x Loukusa V. Nokia Mobile Phones, Yrttipellontie 10, 90230, Oulu, Finland aut Embedded System Level Self-Test for Mixed-Signal IO Verification [Elektronische Daten] [V. Loukusa] This article presents an embedded system level self-test implementation for verification of a peripheral and its connectivity to the system. The self-test enables to perform a test for verifying the IO connectivity from inside the system. The proposed on-chip-testing scheme exploits IC level CMOS testability structures. The IC level DFT structure is verified. The scheme is confirmed by minor silicon overhead. The system level methodology is applied for a peripheral test. The methodology is evaluated by analyzing the response signal and by making a histogram data analysis. The applicability of the methodology is evaluated by comparing it to the existing methods. The article will define the approach, will list the main benefits of this methodology, analyze the laboratory test results and show the changes that need to be implemented in a mixed-signal IC in order to achieve this system level testability. Springer Science + Business Media, LLC, 2006 self-test nationallicence system level nationallicence DFT nationallicence testability nationallicence IO connectivity nationallicence mixed-signal nationallicence histogram nationallicence Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 463-470 0923-8174 22:4-6<463 2006 22 10836 https://doi.org/10.1007/s10836-006-9458-x text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9458-x text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Loukusa V. Nokia Mobile Phones, Yrttipellontie 10, 90230, Oulu, Finland aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 463-470 0923-8174 22:4-6<463 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer