caa a22 4500 467921547 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9499-1 doi (NATIONALLICENCE)springer-10.1007/s10836-006-9499-1 Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits [Elektronische Daten] [Amir Zjajo, Jose Pineda de Gyvez, Guido Gronthoud] A new approach for analog fault modeling and simulation is presented. The proposed approach utilizes the sensitivity of the circuit's DC node voltages to the process variations and consequently the current deviance so as to differentiate the faulty behavior. A systematic method is proposed for the fault discrimination to minimize the probability that the circuit is accepted as a fault-free when it is faulty. Tests are generated and evaluated taking into account the potential fault masking effects of process spread on the faulty circuit responses. The introduced fault model is validated on a time-interleaved sample-and-hold circuit. Simulation results demonstrate the effectiveness of the model. Springer Science + Business Media, LLC, 2006 structural fault modeling nationallicence fault detection nationallicence analog fault modeling nationallicence analog test nationallicence supply current monitoring nationallicence Neyman-Pearson decision nationallicence Zjajo Amir Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands aut Pineda de Gyvez Jose Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands aut Gronthoud Guido Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 399-409 0923-8174 22:4-6<399 2006 22 10836 https://doi.org/10.1007/s10836-006-9499-1 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9499-1 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Zjajo Amir Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands aut NATIONALLICENCE 700 1- Pineda de Gyvez Jose Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands aut NATIONALLICENCE 700 1- Gronthoud Guido Philips Research Laboratories, Prof. Holstlaan 4, 5656 AA, Eindhoven, The Netherlands aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 399-409 0923-8174 22:4-6<399 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer