caa a22 4500 467921555 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-0186-z doi (NATIONALLICENCE)springer-10.1007/s10836-006-0186-z A First Step for an INL Spectral-Based BIST: The Memory Optimization [Elektronische Daten] [V. Kerzérho, S. Bernard, P. Cauvet, J. Janik] Integral non-linearity (INL) is the main static parameter of analog-to-digital converter. This paper presents a comparison between different INL test techniques based on INL estimation from the spectrum of the converted signal. The most common technique is based on polynomial fitting of the INL curve. This technique is well suited to the estimation of a smooth INL curve without sharp transitions. The new method described in the paper is based on a Fourier series expansion of the INL curve. We demonstrate that this new technique allows a more efficient INL estimation. The comparison between the two techniques has been realized thanks to a metrics that considers the uncertainty of production test measurements. Finally, we propose a first step of the study of implementation feasibility of the INL estimation technique. This study focus only on the optimization of required memory. Springer Science + Business Media, LLC, 2006 analog-to-digital converter testing nationallicence integral non-linearity nationallicence polynomial fitting nationallicence Fourier series expansion nationallicence fast Fourier transform nationallicence Kerzérho V. LIRMM, University of Montpellier, CNRS-161 rue Ada, 34392, Montpellier, France aut Bernard S. LIRMM, University of Montpellier, CNRS-161 rue Ada, 34392, Montpellier, France aut Cauvet P. NXP Semiconductors, 2 Rue de la Girafe, B.P. 5120, 14079, Caen Cedex 5, France aut Janik J. GREYC-CNRS UMR 6072, University of Caen, 6 Bd Marechal Juin, 14050, Caen, France aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 351-357 0923-8174 22:4-6<351 2006 22 10836 https://doi.org/10.1007/s10836-006-0186-z text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-0186-z text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Kerzérho V. LIRMM, University of Montpellier, CNRS-161 rue Ada, 34392, Montpellier, France aut NATIONALLICENCE 700 1- Bernard S. LIRMM, University of Montpellier, CNRS-161 rue Ada, 34392, Montpellier, France aut NATIONALLICENCE 700 1- Cauvet P. NXP Semiconductors, 2 Rue de la Girafe, B.P. 5120, 14079, Caen Cedex 5, France aut NATIONALLICENCE 700 1- Janik J. GREYC-CNRS UMR 6072, University of Caen, 6 Bd Marechal Juin, 14050, Caen, France aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 351-357 0923-8174 22:4-6<351 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer