caa a22 4500 467921563 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9460-3 doi (NATIONALLICENCE)springer-10.1007/s10836-006-9460-3 Investigation into the Use of Hybrid Solutions for ΣΔ A/D Converter Testing [Elektronische Daten] [K. Georgopoulos, A. Lechner, M. Burbidge, A. Richardson] ΣΔ ADCs are now extensively used in electronic system applications requiring high resolution analogue to digital interfaces. Many of these applications require low cost solutions that imply the need for efficient production test strategies for verifying performance specifications. Industrial state-of-the-art is based on DSP testing to extract dynamic performance such as THD and SNR from an FFT on a sampled bit-stream from the decimator output. This method is computationally expensive and as resolution increases, the total number of samples required also increases thus pushing total test time beyond acceptable limits. This paper proposes an alternative hybrid solution based on an initial low-cost wafer level screening test followed by a DSP based technique on marginal devices based on alternative DSP transforms. The screening test is applied to the high-frequency bit-stream output of the ΣΔ modulator and has potential for on-chip implementation. Relatively simple algorithms and cross-correlation techniques are used that can associate specific changes in the bit-stream pattern to key failure modes affecting dynamic performance parameters. A simplified supplementary DSP test for marginal devices is proposed that is less computationally intensive than FFT analysis. Springer Science + Business Media, LLC, 2006 ΣΔ converters nationallicence embedded test nationallicence design-for-testability nationallicence BIST nationallicence Georgopoulos K. Centre for Microsystems Engineering, Lancaster University, LA1 4YR, Lancaster, UK aut Lechner A. Centre for Microsystems Engineering, Lancaster University, LA1 4YR, Lancaster, UK aut Burbidge M. Centre for Microsystems Engineering, Lancaster University, LA1 4YR, Lancaster, UK aut Richardson A. Centre for Microsystems Engineering, Lancaster University, LA1 4YR, Lancaster, UK aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 359-370 0923-8174 22:4-6<359 2006 22 10836 https://doi.org/10.1007/s10836-006-9460-3 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9460-3 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Georgopoulos K. Centre for Microsystems Engineering, Lancaster University, LA1 4YR, Lancaster, UK aut NATIONALLICENCE 700 1- Lechner A. Centre for Microsystems Engineering, Lancaster University, LA1 4YR, Lancaster, UK aut NATIONALLICENCE 700 1- Burbidge M. Centre for Microsystems Engineering, Lancaster University, LA1 4YR, Lancaster, UK aut NATIONALLICENCE 700 1- Richardson A. Centre for Microsystems Engineering, Lancaster University, LA1 4YR, Lancaster, UK aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 359-370 0923-8174 22:4-6<359 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer