caa a22 4500 46792158X CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9501-y doi (NATIONALLICENCE)springer-10.1007/s10836-006-9501-y Next Generation ADC Massive Parallel Testing with Real Time Parameter Evaluation [Elektronische Daten] [Heinz Mattes, Stéphane Kirmser, Sebastian Sattler] The paper describes the implementation of a novel Analog-to-Digital-Converter (ADC) test technique for next generation low cost massive parallel ADC testing using a Field Programmable Gate Array (FPGA) on tester load board. The goal is to test the ADC which is embedded in an automotive micro controller with only pure digital tester sources. Therefore, the analog test stimulus for the ADC is generated by using ΔΣ-modulation technique off-line and analog filtering on load board. The digital test response is analyzed by a FPGA in real time by comparing the measured data with a reference signal. The modular concept of FPGA evaluation allows for quick and flexible reaction on changing production test requirements. Simply by reprogramming the FPGA with a new module there is no need of any hardware reconfigurations. Measurements with a high precision reference ADC in laboratory environment show that the method is ready for production. Springer Science + Business Media, LLC, 2006 mixed-signal test nationallicence ADC test nationallicence delta-sigma-converter nationallicence ΔΣ-modulation nationallicence FPGA nationallicence Mattes Heinz Infineon Technologies, 81609, Munich, Germany aut Kirmser Stéphane Infineon Technologies, 81609, Munich, Germany aut Sattler Sebastian Infineon Technologies, 81609, Munich, Germany aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 337-350 0923-8174 22:4-6<337 2006 22 10836 https://doi.org/10.1007/s10836-006-9501-y text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9501-y text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Mattes Heinz Infineon Technologies, 81609, Munich, Germany aut NATIONALLICENCE 700 1- Kirmser Stéphane Infineon Technologies, 81609, Munich, Germany aut NATIONALLICENCE 700 1- Sattler Sebastian Infineon Technologies, 81609, Munich, Germany aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 337-350 0923-8174 22:4-6<337 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer