caa a22 4500 467921598 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9459-9 doi (NATIONALLICENCE)springer-10.1007/s10836-006-9459-9 Built-In-Self-Testing Techniques for Programmable Capacitor Arrays [Elektronische Daten] [Amit Laknaur, Sai Durbha, Haibo Wang] This paper presents efficient built-in-self-testing (BIST) techniques for programmable capacitor arrays (PCAs) on field programmable analog array (FPAA) platforms. The proposed BIST circuits consist of switched-capacitor (SC) integrators and analog window comparators. Taking advantage of FPAA programmable resources, the proposed PCA BIST circuits can be implemented with very small hardware overhead. Also the impact of comparator threshold variations as well as other circuit parasitic effects on the efficiency of the proposed testing method is investigated. Effective circuit techniques along with new comparator designs are presented to minimize the adverse effect of comparator threshold variations. Finally, procedures for using the proposed BIST method to systematically test all PCAs on an FPAA platform are described and experimental results are presented. Springer Science + Business Media, LLC, 2006 built-in-self-testing nationallicence field programmable analog array nationallicence programmable capacitor array nationallicence analog testing nationallicence Laknaur Amit Department of Electrical and Computer Engineering, Southern Illinois University, 62901-6603, Carbondale, IL, USA aut Durbha Sai Department of Electrical and Computer Engineering, Southern Illinois University, 62901-6603, Carbondale, IL, USA aut Wang Haibo Department of Electrical and Computer Engineering, Southern Illinois University, 62901-6603, Carbondale, IL, USA aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 449-462 0923-8174 22:4-6<449 2006 22 10836 https://doi.org/10.1007/s10836-006-9459-9 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9459-9 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Laknaur Amit Department of Electrical and Computer Engineering, Southern Illinois University, 62901-6603, Carbondale, IL, USA aut NATIONALLICENCE 700 1- Durbha Sai Department of Electrical and Computer Engineering, Southern Illinois University, 62901-6603, Carbondale, IL, USA aut NATIONALLICENCE 700 1- Wang Haibo Department of Electrical and Computer Engineering, Southern Illinois University, 62901-6603, Carbondale, IL, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 449-462 0923-8174 22:4-6<449 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer