caa a22 4500 467921601 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9443-4 doi (NATIONALLICENCE)springer-10.1007/s10836-006-9443-4 Towards Fault-Tolerant RF Front Ends [Elektronische Daten] [Tejasvi Das, Anand Gopalan, Clyde Washburn, P. Mukund] The continuing trends of scaling have brought with them an ever-increasing array of process faults and fabrication complexities. The relentless march towards miniaturization and massive integration, in addition to increasing operating frequencies has resulted in increasing concerns about the reliability of integrated RF front-ends. Coupled with rising cost per chip, the fault-tolerant paradigm has become pertinent in the RFIC domain. Due to the high frequencies involved, traditional fault-tolerance methods used in digital and lower frequency analog circuits cannot be applied. We propose a unique methodology to achieve fault-tolerance in RF circuits through dynamic sensing and on-chip self-correction, along with the development of robust algorithms. This technique, which poses minimal overheads and is transparent during ‘normal' use of the circuit, is demonstrated on a cascode LNA, since the LNA is critical for the performance of the entire front-end. We present simulation and fabricated results of the system designed in IBM 0.25μm CMOS 6RF process. Springer Science + Business Media, LLC, 2006 RF front-end nationallicence fault-tolerance nationallicence RF testing nationallicence reliability nationallicence yield nationallicence self-calibration nationallicence LNA nationallicence Das Tejasvi Department of Electrical Engineering, Rochester Institute of Technology, 14623, Rochester, NY, USA aut Gopalan Anand Department of Electrical Engineering, Rochester Institute of Technology, 14623, Rochester, NY, USA aut Washburn Clyde Department of Electrical Engineering, Rochester Institute of Technology, 14623, Rochester, NY, USA aut Mukund P. Department of Electrical Engineering, Rochester Institute of Technology, 14623, Rochester, NY, USA aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 371-386 0923-8174 22:4-6<371 2006 22 10836 https://doi.org/10.1007/s10836-006-9443-4 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9443-4 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Das Tejasvi Department of Electrical Engineering, Rochester Institute of Technology, 14623, Rochester, NY, USA aut NATIONALLICENCE 700 1- Gopalan Anand Department of Electrical Engineering, Rochester Institute of Technology, 14623, Rochester, NY, USA aut NATIONALLICENCE 700 1- Washburn Clyde Department of Electrical Engineering, Rochester Institute of Technology, 14623, Rochester, NY, USA aut NATIONALLICENCE 700 1- Mukund P. Department of Electrical Engineering, Rochester Institute of Technology, 14623, Rochester, NY, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 371-386 0923-8174 22:4-6<371 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer