caa a22 4500 46792161X CHVBK 20180406152918.0 cr unu---uuuuu 170328e20061201xx s 000 0 eng 10.1007/s10836-006-9502-x doi (NATIONALLICENCE)springer-10.1007/s10836-006-9502-x TBSA: Threshold-Based Simulation Accuracy Method for Fast Analog DC Fault Simulation [Elektronische Daten] [Michel Morneau, Abdelhakim Khouas] Starting from a good solution approximation has proved to be very efficient to reduce CPU time required by DC simulation of analog circuits. In order to obtain an additional speedup in DC fault simulation, this paper proposes a new criterion to end the Newton-Raphson (NR) iterative algorithm before convergence. In the case where an initial solution approximation is used, the analysis of the NR algorithm behavior until convergence is presented and a threshold-based simulation accuracy (TBSA) method is then proposed. TBSA stops the iterations when the solution at current NR iteration is enough accurate to immediately classify the fault. According to the detection thresholds, a CPU time/accuracy tradeoff is achieved without altering the fault classification results. The proposed method has been validated on 12 MOS and BJT benchmark circuits considering DC fault simulation under process parameter variations. TBSA is compared to two existing methods which are: standard simulation until convergence method which is accurate but requires a large CPU time, and single NR iteration method which is very fast but without any control over the accuracy. All the compared methods reuse the fault-free circuit results as initial solution for each faulty circuit simulation. It is shown that TBSA requires an intermediate number of NR iterations while achieving correct fault classification, especially for parametric faults which take advantage of using a more accurate initial solution. Springer Science + Business Media, LLC, 2006 analog testing nationallicence DC fault simulation nationallicence analog fault detection nationallicence Newton-Raphson algorithm nationallicence Morneau Michel Electrical engineering department, École Polytechnique de Montréal, C.P. 6079, succ. Centre-Ville, H3C 3A7, Montréal, Québec, Canada aut Khouas Abdelhakim Electrical engineering department, École Polytechnique de Montréal, C.P. 6079, succ. Centre-Ville, H3C 3A7, Montréal, Québec, Canada aut Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 425-436 0923-8174 22:4-6<425 2006 22 10836 https://doi.org/10.1007/s10836-006-9502-x text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-9502-x text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Morneau Michel Electrical engineering department, École Polytechnique de Montréal, C.P. 6079, succ. Centre-Ville, H3C 3A7, Montréal, Québec, Canada aut NATIONALLICENCE 700 1- Khouas Abdelhakim Electrical engineering department, École Polytechnique de Montréal, C.P. 6079, succ. Centre-Ville, H3C 3A7, Montréal, Québec, Canada aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/4-6(2006-12-01), 425-436 0923-8174 22:4-6<425 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer