caa a22 4500 467921636 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20060401xx s 000 0 eng 10.1007/s10836-006-7486-1 doi (NATIONALLICENCE)springer-10.1007/s10836-006-7486-1 Crosstalk Induced Fault Analysis and Test in DRAMs [Elektronische Daten] [Zemo Yang, Samiha Mourad] This study analyzes the effects of crosstalk-induced faults due to parameter variation during the manufacture of DRAMs. The focus is on read operations, which are sensitive to crosstalk and to neighborhood data patterns. Analytical studies and numerical simulations have been used to investigate a class of crosstalk reading faults (CRF) that read operations are susceptible to. The results reveal that there exist worst case data patterns in each physical RAM block and cell arrangement. The worst case data pattern occurs when neighboring and victim bit-lines switch to opposite values at the same time. If the bit-line arrangement is known, the test for the CRFs is quite trivial. If there is no knowledge of the internal chip structure, a deterministic pattern cannot be assigned and therefore a generic test method is needed. In this paper, a test algorithm is proposed that exhausts every state of any 3 or 5 bit-lines of a RAM block. Springer Science + Business Media, LLC, 2006 crosstalk nationallicence DRAMs nationallicence pattern sensitive faults nationallicence Yang Zemo Department of Electrical Engineering, Santa Clara University, 95053, Santa Clara, CA aut Mourad Samiha Department of Electrical Engineering, Santa Clara University, 95053, Santa Clara, CA aut Journal of Electronic Testing Kluwer Academic Publishers 22/2(2006-04-01), 173-187 0923-8174 22:2<173 2006 22 10836 https://doi.org/10.1007/s10836-006-7486-1 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-7486-1 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Yang Zemo Department of Electrical Engineering, Santa Clara University, 95053, Santa Clara, CA aut NATIONALLICENCE 700 1- Mourad Samiha Department of Electrical Engineering, Santa Clara University, 95053, Santa Clara, CA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/2(2006-04-01), 173-187 0923-8174 22:2<173 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer