caa a22 4500 467921652 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20060401xx s 000 0 eng 10.1007/s10836-006-6674-3 doi (NATIONALLICENCE)springer-10.1007/s10836-006-6674-3 Implementing Symmetric Functions with Hierarchical Modules for Stuck-At and Path-Delay Fault Testability [Elektronische Daten] [Hafizur Rahaman, Debesh Das, Bhargab Bhattacharya] A technique for implementing totally symmetric Boolean functions using hierarchical modules is presented. First, a simple cellular module is designed for synthesizing unate symmetric functions. The structure is universal, admits a recursive design, and uses only 2-input AND-OR gates. A universal test set of size (n2/8 + 3n/4) for detecting all single stuck-at faults can be easily determined for an n-input module, where n = 2k, k ≥ 3. General symmetric functions are then realized following a unate decomposition method. The synthesis procedure guarantees full robust path-delay fault testability in the circuit. Experimental results on several symmetric functions reveal that the hardware cost of the proposed design is low, and the number of paths in the circuit is reduced significantly compared to those of earlier designs. Results on circuit area and delay for a few benchmark examples are also reported. Springer Science + Business Media, LLC, 2006 path-delay fault nationallicence stuck-at fault nationallicence symmetric boolean function nationallicence synthesis-for-testability nationallicence unate function nationallicence universal tests nationallicence Rahaman Hafizur Information Technology Department, Bengal Engineering and Science University, 711103, Howrah, India aut Das Debesh Computer Science & Engineering Department, Jadavpur University, 700032, Kolkata, India aut Bhattacharya Bhargab ACM Unit, Indian Statistical Institute, 700108, Kolkata, India aut Journal of Electronic Testing Kluwer Academic Publishers 22/2(2006-04-01), 125-142 0923-8174 22:2<125 2006 22 10836 https://doi.org/10.1007/s10836-006-6674-3 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-6674-3 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Rahaman Hafizur Information Technology Department, Bengal Engineering and Science University, 711103, Howrah, India aut NATIONALLICENCE 700 1- Das Debesh Computer Science & Engineering Department, Jadavpur University, 700032, Kolkata, India aut NATIONALLICENCE 700 1- Bhattacharya Bhargab ACM Unit, Indian Statistical Institute, 700108, Kolkata, India aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/2(2006-04-01), 125-142 0923-8174 22:2<125 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer