caa a22 4500 467921679 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20060401xx s 000 0 eng 10.1007/s10836-006-7427-z doi (NATIONALLICENCE)springer-10.1007/s10836-006-7427-z Impact of Body Bias on Delay Fault Testing of Sub-100nm CMOS Circuits [Elektronische Daten] [Bipul Paul, Kaushik Roy] A Body biasing technique has recently been proposed for microprocessors in sub-100nm technology generations [11, 12]. It is shown that forward body bias (FBB) reduces the leakage power and suppresses the effect of process variation while reducing the complexity of dualVth technology. In this paper, we study the effect of body bias on the delay fault testing of CMOS circuits. We analyze the impact of both fixed and adaptive body biasing techniques on test cost and the quality of test. Statistical analysis on several benchmark circuits shows that the adaptive body biasing design will have the most effective impact on delay fault by maintaining the test cost at its minimum under process variation while ensuring the test quality at its highest level. Springer Science + Business Media, LLC, 2006 delay fault testing nationallicence adaptive body bias design nationallicence process variation nationallicence statistical analysis nationallicence Paul Bipul Toshiba America Research Inc., 2590 Orchard Parkway, 95131, San Jose, CA, USA aut Roy Kaushik School of Electrical and Computer Engineering, Purdue University, 47907-1285, West Lafayette, IN, USA aut Journal of Electronic Testing Kluwer Academic Publishers 22/2(2006-04-01), 115-124 0923-8174 22:2<115 2006 22 10836 https://doi.org/10.1007/s10836-006-7427-z text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-006-7427-z text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Paul Bipul Toshiba America Research Inc., 2590 Orchard Parkway, 95131, San Jose, CA, USA aut NATIONALLICENCE 700 1- Roy Kaushik School of Electrical and Computer Engineering, Purdue University, 47907-1285, West Lafayette, IN, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/2(2006-04-01), 115-124 0923-8174 22:2<115 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer