caa a22 4500 467921725 CHVBK 20180406152918.0 cr unu---uuuuu 170328e20060401xx s 000 0 eng 10.1007/s10836-005-1256-3 doi (NATIONALLICENCE)springer-10.1007/s10836-005-1256-3 Test Planning and Test Resource Optimization for Droplet-Based Microfluidic Systems [Elektronische Daten] [Fei Su, Sule Ozev, Krishnendu Chakrabarty] Recent years have seen the emergence of droplet-based microfluidic systems for safety-critical biomedical applications. In order to ensure reliability, microsystems incorporating microfluidic components must be tested adequately. In this paper, we investigate test planning and test resource optimization for droplet-based microfluidic arrays. We first formulate the test planning problem and prove that it is NP-hard. We then describe an optimization method based on integer linear programming (ILP) that yields optimal solutions. Due to the NP-hard nature of the problem, we develop heuristic approaches for optimization. Experimental results indicate that for large array sizes, the heuristic methods yield solutions that are close to provable lower bounds. These heuristics ensure scalability and low computation cost. Springer Science + Business Media, LLC, 2006 droplet-based microfluidic systems nationallicence concurrent testing nationallicence microfluidic arrays nationallicence test planning nationallicence test resource optimization nationallicence Su Fei Department of Electrical & Computer Engineering, Duke University, 27708, Durham, NC aut Ozev Sule Department of Electrical & Computer Engineering, Duke University, 27708, Durham, NC aut Chakrabarty Krishnendu Department of Electrical & Computer Engineering, Duke University, 27708, Durham, NC aut Journal of Electronic Testing Kluwer Academic Publishers 22/2(2006-04-01), 199-210 0923-8174 22:2<199 2006 22 10836 https://doi.org/10.1007/s10836-005-1256-3 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10836-005-1256-3 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Su Fei Department of Electrical & Computer Engineering, Duke University, 27708, Durham, NC aut NATIONALLICENCE 700 1- Ozev Sule Department of Electrical & Computer Engineering, Duke University, 27708, Durham, NC aut NATIONALLICENCE 700 1- Chakrabarty Krishnendu Department of Electrical & Computer Engineering, Duke University, 27708, Durham, NC aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 22/2(2006-04-01), 199-210 0923-8174 22:2<199 2006 22 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer