<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     caa a22        4500</leader>
  <controlfield tag="001">467926999</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180406152932.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">170328e20060401xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1134/S0020168506040066</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1134/S0020168506040066</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Chromium oxide nanolayers on gallium arsenide</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[Yu. Ezhovskii, A. Egorov]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">Ultrathin chromium oxide layers (nanostructures) are grown on (100) and (110) GaAs substrates by molecular layering (atomic layer deposition). The effect of process conditions on the layer composition and growth mechanism is analyzed. The dielectric properties of the layers and the quality of the dielectric-semiconductor interface are evaluated.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">Pleiades Publishing, Inc., 2006</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Ezhovskii</subfield>
   <subfield code="D">Yu</subfield>
   <subfield code="u">St. Petersburg Technological Institute, Technical University, Moskovskii pr. 26, 190013, St. Petersburg, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Egorov</subfield>
   <subfield code="D">A.</subfield>
   <subfield code="u">St. Petersburg Technological Institute, Technical University, Moskovskii pr. 26, 190013, St. Petersburg, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">Inorganic Materials</subfield>
   <subfield code="d">Nauka/Interperiodica</subfield>
   <subfield code="g">42/4(2006-04-01), 368-373</subfield>
   <subfield code="x">0020-1685</subfield>
   <subfield code="q">42:4&lt;368</subfield>
   <subfield code="1">2006</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">10789</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1134/S0020168506040066</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1134/S0020168506040066</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Ezhovskii</subfield>
   <subfield code="D">Yu</subfield>
   <subfield code="u">St. Petersburg Technological Institute, Technical University, Moskovskii pr. 26, 190013, St. Petersburg, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Egorov</subfield>
   <subfield code="D">A.</subfield>
   <subfield code="u">St. Petersburg Technological Institute, Technical University, Moskovskii pr. 26, 190013, St. Petersburg, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">Inorganic Materials</subfield>
   <subfield code="d">Nauka/Interperiodica</subfield>
   <subfield code="g">42/4(2006-04-01), 368-373</subfield>
   <subfield code="x">0020-1685</subfield>
   <subfield code="q">42:4&lt;368</subfield>
   <subfield code="1">2006</subfield>
   <subfield code="2">42</subfield>
   <subfield code="o">10789</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
