caa a22 4500 467936900 CHVBK 20180406153000.0 cr unu---uuuuu 170328e20060901xx s 000 0 eng 10.1007/s00138-006-0030-6 doi (NATIONALLICENCE)springer-10.1007/s00138-006-0030-6 Fourier-Based Object Description in Defect Image Retrieval [Elektronische Daten] [Iivari Kunttu, Leena Lepistö, Juhani Rauhamaa, Ari Visa] Image retrieval has nowadays several industrial applications. In these imaging applications, which typically use large image archives, the matter of computational efficiency is essential. Therefore, compact and efficient features are required to describe the visual content of the images. In this paper, we introduce a new Fourier-based object descriptor that combines the shape and color information of the objects occurring in images into a single low-dimensional descriptor. The experiments performed with an industrial surface defect image database show that the proposed descriptor is an accurate and computationally light approach to object description in a real-world retrieval problem. Springer-Verlag, 2006 Object description nationallicence Shape classification nationallicence Fourier descriptor nationallicence Defect image retrieval nationallicence Kunttu Iivari Tampere University of Technology, Institute of Signal Processing, P.O. Box 553, Tampere, Finland aut Lepistö Leena Tampere University of Technology, Institute of Signal Processing, P.O. Box 553, Tampere, Finland aut Rauhamaa Juhani Process Industry, ABB Oy, P.O. Box 94, Helsinki, Finland aut Visa Ari Tampere University of Technology, Institute of Signal Processing, P.O. Box 553, Tampere, Finland aut Machine Vision and Applications Springer-Verlag 17/4(2006-09-01), 211-218 0932-8092 17:4<211 2006 17 138 https://doi.org/10.1007/s00138-006-0030-6 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s00138-006-0030-6 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Kunttu Iivari Tampere University of Technology, Institute of Signal Processing, P.O. Box 553, Tampere, Finland aut NATIONALLICENCE 700 1- Lepistö Leena Tampere University of Technology, Institute of Signal Processing, P.O. Box 553, Tampere, Finland aut NATIONALLICENCE 700 1- Rauhamaa Juhani Process Industry, ABB Oy, P.O. Box 94, Helsinki, Finland aut NATIONALLICENCE 700 1- Visa Ari Tampere University of Technology, Institute of Signal Processing, P.O. Box 553, Tampere, Finland aut NATIONALLICENCE 773 0- Machine Vision and Applications Springer-Verlag 17/4(2006-09-01), 211-218 0932-8092 17:4<211 2006 17 138 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer