caa a22 4500 467943311 CHVBK 20180322200724.0 cr unu---uuuuu 170328e19861001xx s 000 0 eng 10.1007/BF02403008 doi (NATIONALLICENCE)springer-10.1007/BF02403008 (NATIONALLICENCE)springer-10.1007/BF00553806 Craze microstructure characterization by low-angle electron diffraction and Fourier transforms of craze images [Elektronische Daten] [Arnold Yang, Edward Kramer] Craze microstructure in thin film monodisperse polystyrene (PS) was determined by three equivalent, but independent, techniques: (1) low-angle electron diffraction (LAED) from the crazes, (2) the image analysis of microdensitometer scans of craze TEM images, and (3) optical transforms of the TEM images. Molecular weights of 11×104 and 18×105 were investigated. The average craze fibril spacings and fibril diameters in the samples were measured by LAED and then compared with those obtained from the image analyses. Excellent agreement was found between the three techniques, indicating that any one can be used for craze fibril structure exploration. While the craze fibril structure near the craze-matrix interface of crazes in both the 18×105 and 11×104 were similar, the fibril structure was coarser in the centre of 11×104 crazes than in 18×105 crazes. This effect is believed to be due to fibril coalescence in the centre of the low molecular weight crazes during the very low strain rate tensile deformation used to produce those crazes. Chapman and Hall Ltd, 1986 Yang Arnold Department of Materials Science and Engineering and the Materials Science Center, Cornell University, 14853, Ithaca, New York, USA aut Kramer Edward Department of Materials Science and Engineering and the Materials Science Center, Cornell University, 14853, Ithaca, New York, USA aut Journal of Materials Science Kluwer Academic Publishers 21/10(1986-10-01), 3601-3610 0022-2461 21:10<3601 1986 21 10853 https://doi.org/10.1007/BF02403008 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02403008 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Yang Arnold Department of Materials Science and Engineering and the Materials Science Center, Cornell University, 14853, Ithaca, New York, USA aut NATIONALLICENCE 700 1- Kramer Edward Department of Materials Science and Engineering and the Materials Science Center, Cornell University, 14853, Ithaca, New York, USA aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers 21/10(1986-10-01), 3601-3610 0022-2461 21:10<3601 1986 21 10853 NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00553806 text/html Onlinezugriff via DOI Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE NATIONALLICENCE NL-springer