<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     caa a22        4500</leader>
  <controlfield tag="001">467944997</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180323165700.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">170328e19901001xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/BF00153860</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/BF00153860</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/BF00938686</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">Exact probabilistic testability measures for multi-output circuits</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[P. Camurati, P. Prinetto, M. Reorda]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">The computation of probabilistic testability measures has become increasingly important and some methods have been proposed, although the exact solution of the problem is NP-hard. An exact analytical method for singleoutput combinational circuits is extended to deal with multi-output circuits. Such circuits are reduced to singleoutput ones by introducing a dummy gate, the &quot;X-gate,” and applying to the resulting graph the analysis based on supergates.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">Kluwer Academic Publishers, 1990</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">Built-in self-test</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">CAD tools</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">probabilistic testability analysis</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="690" ind1=" " ind2="7">
   <subfield code="a">test-pattern generation</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Camurati</subfield>
   <subfield code="D">P.</subfield>
   <subfield code="u">Dipartimento di Automatica e Informatica, Politecnico di Torino, Corso Duca degli Abruzzi 24, I-10129, Turin, Italy</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Prinetto</subfield>
   <subfield code="D">P.</subfield>
   <subfield code="u">Dipartimento di Automatica e Informatica, Politecnico di Torino, Corso Duca degli Abruzzi 24, I-10129, Turin, Italy</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Reorda</subfield>
   <subfield code="D">M.</subfield>
   <subfield code="u">Dipartimento di Automatica e Informatica, Politecnico di Torino, Corso Duca degli Abruzzi 24, I-10129, Turin, Italy</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">Journal of Electronic Testing</subfield>
   <subfield code="d">Kluwer Academic Publishers</subfield>
   <subfield code="g">1/3(1990-10-01), 229-234</subfield>
   <subfield code="x">0923-8174</subfield>
   <subfield code="q">1:3&lt;229</subfield>
   <subfield code="1">1990</subfield>
   <subfield code="2">1</subfield>
   <subfield code="o">10836</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/BF00153860</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/BF00153860</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Camurati</subfield>
   <subfield code="D">P.</subfield>
   <subfield code="u">Dipartimento di Automatica e Informatica, Politecnico di Torino, Corso Duca degli Abruzzi 24, I-10129, Turin, Italy</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Prinetto</subfield>
   <subfield code="D">P.</subfield>
   <subfield code="u">Dipartimento di Automatica e Informatica, Politecnico di Torino, Corso Duca degli Abruzzi 24, I-10129, Turin, Italy</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Reorda</subfield>
   <subfield code="D">M.</subfield>
   <subfield code="u">Dipartimento di Automatica e Informatica, Politecnico di Torino, Corso Duca degli Abruzzi 24, I-10129, Turin, Italy</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">Journal of Electronic Testing</subfield>
   <subfield code="d">Kluwer Academic Publishers</subfield>
   <subfield code="g">1/3(1990-10-01), 229-234</subfield>
   <subfield code="x">0923-8174</subfield>
   <subfield code="q">1:3&lt;229</subfield>
   <subfield code="1">1990</subfield>
   <subfield code="2">1</subfield>
   <subfield code="o">10836</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/BF00938686</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
