caa a22 4500 467945144 CHVBK 20180323165700.0 cr unu---uuuuu 170328e19901001xx s 000 0 eng 10.1007/BF00938681 doi (NATIONALLICENCE)springer-10.1007/BF00938681 (NATIONALLICENCE)springer-10.1007/BF00153855 Extended selection of switching target faults in CONT algorithm for test generation [Elektronische Daten] [Yuzo Takamatsu, Kozo Kinoshita] We describe an extended selection of switching target faults in the CONT algorithm. The main difficulty in test generation is the conflict that arises in the process of determining the signal values due to reconvergent fanouts. Conventional approaches for test generation change a signal value, which causes conflicts to another possible choice for backtracking. In the CONT algorithm, a strategy of switching target fault was proposed as a new backtracking mechanism. In this method, the target fault is switched to a new target fault instead of making an alternative assignment on the primary input value when a conflict occurs. A disadvantage of the CONT algorithm is that unjustified lines exist in the process of test generation. These unjustified lines make the procedure of switching targets complicated and restrict the possible choice in selecting the new target fault. In the new version of CONT, called CONT-2, we have removed the unjustified lines in the process of test generation and have extended to two target-fault types for switching targets. Implementing CONT-2 by a Fortran program, ISCAS85 benchmark circuits are examined. Experiments on a combined system with fault simulation followed by CONT-2 are also presented. Kluwer Academic Publishers, 1990 D-algorithm nationallicence fault simulation nationallicence fault target switching nationallicence Takamatsu Yuzo Department of Computer Science, Faculty of Engineering, Ehime University, Bunkyo-cho, 790, Matsuyama, Japan aut Kinoshita Kozo Department of Applied Physics, Faculty of Engineering, Osaka University, Yamadaoka, 565, Suita, Japan aut Journal of Electronic Testing Kluwer Academic Publishers 1/3(1990-10-01), 183-189 0923-8174 1:3<183 1990 1 10836 https://doi.org/10.1007/BF00938681 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00938681 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Takamatsu Yuzo Department of Computer Science, Faculty of Engineering, Ehime University, Bunkyo-cho, 790, Matsuyama, Japan aut NATIONALLICENCE 700 1- Kinoshita Kozo Department of Applied Physics, Faculty of Engineering, Osaka University, Yamadaoka, 565, Suita, Japan aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 1/3(1990-10-01), 183-189 0923-8174 1:3<183 1990 1 10836 NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00153855 text/html Onlinezugriff via DOI Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE NATIONALLICENCE NL-springer