caa a22 4500 467945357 CHVBK 20180323165700.0 cr unu---uuuuu 170328e19901001xx s 000 0 eng 10.1007/BF00938685 doi (NATIONALLICENCE)springer-10.1007/BF00938685 (NATIONALLICENCE)springer-10.1007/BF00153859 Finite state machine synthesis with embedded test function [Elektronische Daten] [Vishwani Agrawal, Kwang-Ting Cheng] We propose a synthesis for a testability method in which the test function is incorporated into the state diagram of the finite state machine (FSM). The test function is specified as an FSM with the same number of state variables as the given object machine. Based upon the chosen test methodology, a variety of test functions can be defined. As an illustration, we construct a test machine in which each state is uniquely set and observed by an input sequence no longer than ⌈log k n⌉, wheren is the number of states and the integerk is a design parameter. The state transition graph of the test machine is superimposed on the state graph of the object function such that a minimal number of new transitions are added. State assignment, logic minimization, and technology mapping are carried out for the combined graph. By design, the embedded test machine is fully testable. Also, since the test machine can control all memory elements, the circuit is effectively tested by a combinational circuit test generator. Scan register is shown to be a special case in this methodology. Kluwer Academic Publishers, 1990 Computer-Aided Design nationallicence Logic Synthesis nationallicence Synthesis for Testability nationallicence Test Generation nationallicence VLSI nationallicence Agrawal Vishwani AT&T Bell Laboratories, 07974, Murray Hill, NJ, USA aut Cheng Kwang-Ting AT&T Bell Laboratories, 07974, Murray Hill, NJ, USA aut Journal of Electronic Testing Kluwer Academic Publishers 1/3(1990-10-01), 221-228 0923-8174 1:3<221 1990 1 10836 https://doi.org/10.1007/BF00938685 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00938685 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Agrawal Vishwani AT&T Bell Laboratories, 07974, Murray Hill, NJ, USA aut NATIONALLICENCE 700 1- Cheng Kwang-Ting AT&T Bell Laboratories, 07974, Murray Hill, NJ, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 1/3(1990-10-01), 221-228 0923-8174 1:3<221 1990 1 10836 NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00153859 text/html Onlinezugriff via DOI Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE NATIONALLICENCE NL-springer