caa a22 4500 467948089 CHVBK 20180406192147.0 cr unu---uuuuu 170328e20060201xx s 000 0 eng 10.1007/s10909-006-9004-3 doi (NATIONALLICENCE)springer-10.1007/s10909-006-9004-3 (NATIONALLICENCE)springer-10.1007/BF02679479 Measuring Energies at the Nanometer-Scale of Molecular Organic Materials with an Atomic Force Microscope: TTF-TCNQ as a Case Study [Elektronische Daten] [J. Fraxedas, J. Langer, I. Díez, F. Sanz] The elastic response of molecular organic materials to external mechanical nanoindentations in the nano- and low micronewton force range can be characterized using ultrasharp cantilever tips of an Atomic Force Microscope (AFM). Because clear distinction between elastic and plastic deformation is achieved, the maximal accumulated elastic energy can be directly determined from the force vs. penetration curves, giving an estimate of the characteristic energies of the materials. Springer Science+Business Media, Inc, 2006 atomic force microscopy nationallicence molecular organic materials nationallicence TTF-TCNQ nationallicence 68.35-p nationallicence 68.37 Ps nationallicence Fraxedas J. Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, E-08193, Bellaterra, Spain aut Langer J. Institut für Chemie und Biochemie, Physikalische und Theoretische Chemie, Freie Universität Berlin, D-14195, Berlin, Germany aut Díez I. Center of Bioelectronics & Nanobioscience and Departament de Química Física, Universitat de Barcelona, Martí i Franqués 1, E-08028, Barcelona, Spain aut Sanz F. Center of Bioelectronics & Nanobioscience and Departament de Química Física, Universitat de Barcelona, Martí i Franqués 1, E-08028, Barcelona, Spain aut Journal of Low Temperature Physics Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 142/3-4(2006-02-01), 121-126 0022-2291 142:3-4<121 2006 142 10909 https://doi.org/10.1007/s10909-006-9004-3 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/s10909-006-9004-3 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Fraxedas J. Institut de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, E-08193, Bellaterra, Spain aut NATIONALLICENCE 700 1- Díez I. Center of Bioelectronics & Nanobioscience and Departament de Química Física, Universitat de Barcelona, Martí i Franqués 1, E-08028, Barcelona, Spain aut NATIONALLICENCE 700 1- Sanz F. Center of Bioelectronics & Nanobioscience and Departament de Química Física, Universitat de Barcelona, Martí i Franqués 1, E-08028, Barcelona, Spain aut NATIONALLICENCE 773 0- Journal of Low Temperature Physics Kluwer Academic Publishers-Plenum Publishers; http://www.springer-ny.com 142/3-4(2006-02-01), 121-126 0022-2291 142:3-4<121 2006 142 10909 NATIONALLICENCE 700 1- Langer J. Institut für Chemie und Biochemie, Physikalische und Theoretische Chemie, Freie Universität Berlin, D-14195, Berlin, Germany aut NATIONALLICENCE 700 1- Fraxedas J. Institute de Ciència de Materials de Barcelona (ICMAB-CSIC), Campus UAB, E-08193, Bellaterra, Spain aut NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02679479 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Díez I. Center of Bioelectronics & Nanobioscience and Department de Química Física, Universitat de Barcelona, Martí i Franquès 1, E-08028, Barcelona, Spain aut NATIONALLICENCE 700 1- Sanz F. Center of Bioelectronics & Nanobioscience and Department de Química Física, Universitat de Barcelona, Martí i Franquès 1, E-08028, Barcelona, Spain aut NATIONALLICENCE 773 0- Journal of Low Temperature Physics Springer-Verlag 142/3-4(2006-02-01), 121-126 0022-2291 142:3-4<121 2006 142 10909 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE NATIONALLICENCE NL-springer