caa a22 4500 467950253 CHVBK 20180323165702.0 cr unu---uuuuu 170328e19901001xx s 000 0 eng 10.1007/BF00938687 doi (NATIONALLICENCE)springer-10.1007/BF00938687 (NATIONALLICENCE)springer-10.1007/BF00153861 Probabilistic fault grading based on activation checking and observability analysis [Elektronische Daten] [Masahisa Nakazawa, Susumu Nitta, Kanji Hirabayashi] A simplified probabilistic fault grading method is described. The concept of propagation probability is introduced in place of the sensitization probability of STAFAN, and the empirical parameters of STAFAN are eliminated. The division of input vectors into subsets is monitored by the activation or toggle rate. The accuracy of the method is examined for fault coverage estimation and for predicting the undetected faults. Kluwer Academic Publishers, 1990 activation checking nationallicence controllability nationallicence detectability nationallicence fault-free simulation nationallicence fault grading nationallicence observability nationallicence statistical fault analysis nationallicence Nakazawa Masahisa VLSI Research Center, TOSHIBA Corporation, 1 Komukai-Toshiba, 210, Kawasaki, Japan aut Nitta Susumu VLSI Research Center, TOSHIBA Corporation, 1 Komukai-Toshiba, 210, Kawasaki, Japan aut Hirabayashi Kanji VLSI Research Center, TOSHIBA Corporation, 1 Komukai-Toshiba, 210, Kawasaki, Japan aut Journal of Electronic Testing Kluwer Academic Publishers 1/3(1990-10-01), 235-238 0923-8174 1:3<235 1990 1 10836 https://doi.org/10.1007/BF00938687 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00938687 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Nakazawa Masahisa VLSI Research Center, TOSHIBA Corporation, 1 Komukai-Toshiba, 210, Kawasaki, Japan aut NATIONALLICENCE 700 1- Nitta Susumu VLSI Research Center, TOSHIBA Corporation, 1 Komukai-Toshiba, 210, Kawasaki, Japan aut NATIONALLICENCE 700 1- Hirabayashi Kanji VLSI Research Center, TOSHIBA Corporation, 1 Komukai-Toshiba, 210, Kawasaki, Japan aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 1/3(1990-10-01), 235-238 0923-8174 1:3<235 1990 1 10836 NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00153861 text/html Onlinezugriff via DOI Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE NATIONALLICENCE NL-springer