caa a22 4500 467952698 CHVBK 20180322200726.0 cr unu---uuuuu 170328e19861001xx s 000 0 eng 10.1007/BF02403002 doi (NATIONALLICENCE)springer-10.1007/BF02403002 (NATIONALLICENCE)springer-10.1007/BF00553800 Topography of etched rhombohedral faces of quartz crystals: evidence for orientation effects [Elektronische Daten] [M. Castagliola, C. Tellier, J. Vaterkowski] A study has been made of the rate at which the rhombohedral faces of a natural quartz crystal are etched in a concentrated ammonium bifluoride solution. The thickness of the disturbed surface layer created by an initial mechanical lapping is estimated from rate data. The etching rate as well as this thickness are found to be sensitive to natural face orientation. The changes in the surface texture of the rhombohedral faces with repeated chemical etchings are investigated. The variation in the roughness parameters with the average depth of etch shows both directional and orientation effects. The chemical attack results in the formation of stable etch figures characteristic to the orientation of the surface on which they lie and which enlarge with repeated etchings. finally, schematic etch figures are proposed for the differently oriented rhombohedral faces. Chapman and Hall Ltd, 1986 Castagliola M. Laboratoire de Chronometrie, Electronique et Piézoélectricité, Ecole Nationale Supérieure de Mécanique et des Microtechniques, Route de Gray, La Bouloie, 25030, Besancon Cedex, France aut Tellier C. Laboratoire de Chronometrie, Electronique et Piézoélectricité, Ecole Nationale Supérieure de Mécanique et des Microtechniques, Route de Gray, La Bouloie, 25030, Besancon Cedex, France aut Vaterkowski J. Laboratoire de Chronometrie, Electronique et Piézoélectricité, Ecole Nationale Supérieure de Mécanique et des Microtechniques, Route de Gray, La Bouloie, 25030, Besancon Cedex, France aut Journal of Materials Science Kluwer Academic Publishers 21/10(1986-10-01), 3551-3560 0022-2461 21:10<3551 1986 21 10853 https://doi.org/10.1007/BF02403002 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02403002 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Castagliola M. Laboratoire de Chronometrie, Electronique et Piézoélectricité, Ecole Nationale Supérieure de Mécanique et des Microtechniques, Route de Gray, La Bouloie, 25030, Besancon Cedex, France aut NATIONALLICENCE 700 1- Tellier C. Laboratoire de Chronometrie, Electronique et Piézoélectricité, Ecole Nationale Supérieure de Mécanique et des Microtechniques, Route de Gray, La Bouloie, 25030, Besancon Cedex, France aut NATIONALLICENCE 700 1- Vaterkowski J. Laboratoire de Chronometrie, Electronique et Piézoélectricité, Ecole Nationale Supérieure de Mécanique et des Microtechniques, Route de Gray, La Bouloie, 25030, Besancon Cedex, France aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers 21/10(1986-10-01), 3551-3560 0022-2461 21:10<3551 1986 21 10853 NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00553800 text/html Onlinezugriff via DOI Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE NATIONALLICENCE NL-springer