<?xml version="1.0" encoding="UTF-8"?>
<collection xmlns="http://www.loc.gov/MARC21/slim">
 <record>
  <leader>     caa a22        4500</leader>
  <controlfield tag="001">467953325</controlfield>
  <controlfield tag="003">CHVBK</controlfield>
  <controlfield tag="005">20180405193744.0</controlfield>
  <controlfield tag="007">cr unu---uuuuu</controlfield>
  <controlfield tag="008">170328e20050101xx      s     000 0 eng  </controlfield>
  <datafield tag="024" ind1="7" ind2="0">
   <subfield code="a">10.1007/PL00021852</subfield>
   <subfield code="2">doi</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/PL00021852</subfield>
  </datafield>
  <datafield tag="035" ind1=" " ind2=" ">
   <subfield code="a">(NATIONALLICENCE)springer-10.1007/s10740-005-0043-2</subfield>
  </datafield>
  <datafield tag="245" ind1="0" ind2="0">
   <subfield code="a">VUV Radiation spectra of erosion plasma of a jet of high-current diaphragm discharge in vacuum</subfield>
   <subfield code="h">[Elektronische Daten]</subfield>
   <subfield code="c">[E. Kalashnikov, A. Bedrin, S. Rachkulik, A. Zhilin, V. El'ts]</subfield>
  </datafield>
  <datafield tag="520" ind1="3" ind2=" ">
   <subfield code="a">Experimental results are given of spectral investigations of radiation of a cathode jet of varying chemical composition produced by a diaphragm discharge in a vacuum ultraviolet spectral region (115-190 nm) under conditions of magnetogasdynamic flow of plasma over a decimeter-scale interelectrode gap.</subfield>
  </datafield>
  <datafield tag="540" ind1=" " ind2=" ">
   <subfield code="a">Springer Science+Business Media, Inc., 2005</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Kalashnikov</subfield>
   <subfield code="D">E.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Bedrin</subfield>
   <subfield code="D">A.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Rachkulik</subfield>
   <subfield code="D">S.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">Zhilin</subfield>
   <subfield code="D">A.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="700" ind1="1" ind2=" ">
   <subfield code="a">El'ts</subfield>
   <subfield code="D">V.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="773" ind1="0" ind2=" ">
   <subfield code="t">High Temperature</subfield>
   <subfield code="d">Kluwer Academic Publishers-Consultants Bureau</subfield>
   <subfield code="g">43/1(2005-01-01), 31-37</subfield>
   <subfield code="x">0018-151X</subfield>
   <subfield code="q">43:1&lt;31</subfield>
   <subfield code="1">2005</subfield>
   <subfield code="2">43</subfield>
   <subfield code="o">10740</subfield>
  </datafield>
  <datafield tag="856" ind1="4" ind2="0">
   <subfield code="u">https://doi.org/10.1007/PL00021852</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="908" ind1=" " ind2=" ">
   <subfield code="D">1</subfield>
   <subfield code="a">research-article</subfield>
   <subfield code="2">jats</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/PL00021852</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Kalashnikov</subfield>
   <subfield code="D">E.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Bedrin</subfield>
   <subfield code="D">A.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Rachkulik</subfield>
   <subfield code="D">S.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">Zhilin</subfield>
   <subfield code="D">A.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">700</subfield>
   <subfield code="E">1-</subfield>
   <subfield code="a">El'ts</subfield>
   <subfield code="D">V.</subfield>
   <subfield code="u">Research Institute for Integrated Testing of Optoelectronic Devices (NIIKI OEP), 188540, Sosnovyi Bor, Leningrad oblast, Russia</subfield>
   <subfield code="4">aut</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">773</subfield>
   <subfield code="E">0-</subfield>
   <subfield code="t">High Temperature</subfield>
   <subfield code="d">Kluwer Academic Publishers-Consultants Bureau</subfield>
   <subfield code="g">43/1(2005-01-01), 31-37</subfield>
   <subfield code="x">0018-151X</subfield>
   <subfield code="q">43:1&lt;31</subfield>
   <subfield code="1">2005</subfield>
   <subfield code="2">43</subfield>
   <subfield code="o">10740</subfield>
  </datafield>
  <datafield tag="950" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="P">856</subfield>
   <subfield code="E">40</subfield>
   <subfield code="u">https://doi.org/10.1007/s10740-005-0043-2</subfield>
   <subfield code="q">text/html</subfield>
   <subfield code="z">Onlinezugriff via DOI</subfield>
  </datafield>
  <datafield tag="900" ind1=" " ind2="7">
   <subfield code="a">Metadata rights reserved</subfield>
   <subfield code="b">Springer special CC-BY-NC licence</subfield>
   <subfield code="2">nationallicence</subfield>
  </datafield>
  <datafield tag="898" ind1=" " ind2=" ">
   <subfield code="a">BK010053</subfield>
   <subfield code="b">XK010053</subfield>
   <subfield code="c">XK010000</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
  <datafield tag="949" ind1=" " ind2=" ">
   <subfield code="B">NATIONALLICENCE</subfield>
   <subfield code="F">NATIONALLICENCE</subfield>
   <subfield code="b">NL-springer</subfield>
  </datafield>
 </record>
</collection>
