caa a22 4500 467953902 CHVBK 20180322200727.0 cr unu---uuuuu 170328e19861101xx s 000 0 eng 10.1007/BF00553445 doi (NATIONALLICENCE)springer-10.1007/BF00553445 (NATIONALLICENCE)springer-10.1007/BF02431628 Turner Charles Department of Biomedical Engineering, Tulane University, 70118, New Orleans, Louisiana, USA aut Boundary length and internal surface area measurements in porous materials with elliptical pores [Elektronische Daten] [Charles Turner] Formulae are derived for the stereological determination of boundary length per unit area,B A, and surface density,S v, in materials with elliptically shaped pores. These relationships are valid for two-phase solids with orthotropically distributed internal surfaces (surfaces that can be mapped onto an ellipsoid). Maximum and minimum mean intercept length measurements in a plane are needed to calculateB A. Mean intercept length measurements in the three principal directions of porous symmetry are necessary to calculateS v. If the principal directions are not known they can be found by calculating the eigenvectors of a second rank tensor called the mean intercept length tensor. In a material with a transversely isotropic distribution of internal surfaces (surfaces that can be mapped onto a spheroid), mean intercept length measurements along and transverse to the axis of symmetry are needed to calculateS v. Chapman and Hall Ltd., 1986 Journal of Materials Science Kluwer Academic Publishers 21/11(1986-11-01), 3907-3911 0022-2461 21:11<3907 1986 21 10853 https://doi.org/10.1007/BF00553445 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00553445 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Turner Charles Department of Biomedical Engineering, Tulane University, 70118, New Orleans, Louisiana, USA aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers 21/11(1986-11-01), 3907-3911 0022-2461 21:11<3907 1986 21 10853 NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02431628 text/html Onlinezugriff via DOI Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE NATIONALLICENCE NL-springer