caa a22 4500 467954534 CHVBK 20180322200727.0 cr unu---uuuuu 170328e19861101xx s 000 0 eng 10.1007/BF00553465 doi (NATIONALLICENCE)springer-10.1007/BF00553465 (NATIONALLICENCE)springer-10.1007/BF02431648 Characterization of the interface between (U, M)O2±x and yttria-zirconia [Elektronische Daten] [S. Badwal, F. Ciacchi, D. Sood] Solid-state electrochemical cells have been prepared by co-sintering pre-reacted electrode and electrolyte materials together. The electrodes investigated were the non-stoichiometric oxides of the general formula (U, M)O2±x (M = Sc, Y) and the electrolyte used was yttria-stabilized zirconia. The specimens were characterized by X-ray diffraction, Rutherford back-scattering spectrometry, scanning electron microscopy with energy-dispersive analysis by X-rays, and optical microscopy. For M = Sc, an intermediate phase is formed at the interface and is responsible for the strong bonding of the electrode layer to the electrolyte. The thickness of the intermediate layer was about 2 to 3Μm. Considerable loss of uranium, which in some cases led to destabilization of the fluorite phase, was observed from the surface of the uraniascandia electrode layers. The intermediate phase is thought to be formed as a result of reaction between the electrolyte and volatile uranium-containing species produced by decomposition of the urania-scandia electrode material. For M = Y, no evidence for the formation of such a phase was found and the adhesion of the electrode to electrolyte was poor. Chapman and Hall Ltd., 1986 Badwal S. Division of Materials Science, CSIRO, Locked Bag 33, 3168, Clayton, Victoria, Australia aut Ciacchi F. Division of Materials Science, CSIRO, Locked Bag 33, 3168, Clayton, Victoria, Australia aut Sood D. Microelectronics Technology Centre, Royal Melbourne Institute of Technology, 3000, Melbourne, Victoria, Australia aut Journal of Materials Science Kluwer Academic Publishers 21/11(1986-11-01), 4035-4042 0022-2461 21:11<4035 1986 21 10853 https://doi.org/10.1007/BF00553465 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00553465 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Badwal S. Division of Materials Science, CSIRO, Locked Bag 33, 3168, Clayton, Victoria, Australia aut NATIONALLICENCE 700 1- Ciacchi F. Division of Materials Science, CSIRO, Locked Bag 33, 3168, Clayton, Victoria, Australia aut NATIONALLICENCE 700 1- Sood D. Microelectronics Technology Centre, Royal Melbourne Institute of Technology, 3000, Melbourne, Victoria, Australia aut NATIONALLICENCE 773 0- Journal of Materials Science Kluwer Academic Publishers 21/11(1986-11-01), 4035-4042 0022-2461 21:11<4035 1986 21 10853 NATIONALLICENCE 856 40 https://doi.org/10.1007/BF02431648 text/html Onlinezugriff via DOI Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer NATIONALLICENCE NATIONALLICENCE NL-springer