caa a22 4500 467995680 CHVBK 20180323112556.0 cr unu---uuuuu 170328e19900101xx s 000 0 eng 10.1007/BF01244153 doi (NATIONALLICENCE)springer-10.1007/BF01244153 Organic surface analysis with time-of-flight SIMS [Elektronische Daten] [Hans van der Wel, Johan Lub, Peter van Velzen, Alfred Benninghoven] In the last few years static secondary ion mass spectrometry (SSIMS) has proved to be a versatile and indispensable method for determining the composition and the structure of the outermost molecular layers of a surface. In particular when using a high-resolution time-of-flight (TOF) mass analyser a high sensitivity can be obtained with SSIMS. In this review it will be shown that the analysis of surfaces with a well-defined chemical structure by means of SSIMS has given detailed insight into the relation between the structure of the fragment ions formed by ion bombardment of the surface and the original surface structure. These studies have also improved the possibilities for quantifying the SSIMS results. In addition, the better knowledge about the ionformation process can be used for the analysis of surfaces of unknown composition and structure. Finally, some recent applications of SSIMS will be presented. Springer-Verlag, 1990 static secondary ion mass spectrometry nationallicence ion-formation nationallicence quantification nationallicence organic surface analysis nationallicence time-of-flight nationallicence van der Wel Hans Philips Research Laboratories, P. O. Box 80.000, NL-5600, JA Eindhoven, The Netherlands aut Lub Johan Philips Research Laboratories, P. O. Box 80.000, NL-5600, JA Eindhoven, The Netherlands aut van Velzen Peter Philips Research Laboratories, P. O. Box 80.000, NL-5600, JA Eindhoven, The Netherlands aut Benninghoven Alfred Physikalisches Institut, Universität Münster, D-4400, Münster, Federal Republic of Germany aut Microchimica Acta Springer-Verlag 101/1-6(1990-01-01), 3-18 0026-3672 101:1-6<3 1990 101 604 https://doi.org/10.1007/BF01244153 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF01244153 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- van der Wel Hans Philips Research Laboratories, P. O. Box 80.000, NL-5600, JA Eindhoven, The Netherlands aut NATIONALLICENCE 700 1- Lub Johan Philips Research Laboratories, P. O. Box 80.000, NL-5600, JA Eindhoven, The Netherlands aut NATIONALLICENCE 700 1- van Velzen Peter Philips Research Laboratories, P. O. Box 80.000, NL-5600, JA Eindhoven, The Netherlands aut NATIONALLICENCE 700 1- Benninghoven Alfred Physikalisches Institut, Universität Münster, D-4400, Münster, Federal Republic of Germany aut NATIONALLICENCE 773 0- Microchimica Acta Springer-Verlag 101/1-6(1990-01-01), 3-18 0026-3672 101:1-6<3 1990 101 604 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer