caa a22 4500 467995729 CHVBK 20180323112556.0 cr unu---uuuuu 170328e19900101xx s 000 0 eng 10.1007/BF01244154 doi (NATIONALLICENCE)springer-10.1007/BF01244154 Ullrich Hans Department of Materials Science, Technical University of Dresden, Mommsenstrasse 13, DDR-8027, Dresden, German Democratic Republic aut Progress in the field of Kossel and pseudo-Kossel technique [Elektronische Daten] [Hans Ullrich] A review of new methods and equipments of Kossel and pseudo-Kossel technique is given. The importance of line profiles for crystal and real structure analysis is stressed. The state of the art for determination of crystallographic parameters is described, and future trends (assessment of dislocation density, investigation of radiation defects) are discussed. A very important application is the optimization of the technology for transformer core sheets. Springer-Verlag, 1990 Kossel technique nationallicence divergent beam X-ray diffraction nationallicence Microchimica Acta Springer-Verlag 101/1-6(1990-01-01), 19-24 0026-3672 101:1-6<19 1990 101 604 https://doi.org/10.1007/BF01244154 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF01244154 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Ullrich Hans Department of Materials Science, Technical University of Dresden, Mommsenstrasse 13, DDR-8027, Dresden, German Democratic Republic aut NATIONALLICENCE 773 0- Microchimica Acta Springer-Verlag 101/1-6(1990-01-01), 19-24 0026-3672 101:1-6<19 1990 101 604 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer