caa a22 4500 467995796 CHVBK 20180323112556.0 cr unu---uuuuu 170328e19900101xx s 000 0 eng 10.1007/BF01244158 doi (NATIONALLICENCE)springer-10.1007/BF01244158 Gries Werner Research Institute of the Deutsche Bundespost, FTZ, P. O. Box 5000, D-6100, Darmstadt, Federal Republic of Germany aut The fitting of depth distributions of ion implanted analytes by split student- t functions: The physical basis and a recommended procedure [Elektronische Daten] [Werner Gries] The non-standardized fitting of depth distributions of ion implanted analytes in solid matrices by arbitrarily chosen functions, as practiced at present, is unsatisfactory for the communication of results and is unacceptable for certification of ion implanted reference materials. Sampling theory applied to the "nuclear” slowing-down process of swift ions suggests that split Student-t functions should provide the mathematical representation sought. The exact shape and mathematical form of these functions are fully described and readily communicated by the use of five parameters (mode, two shape parameters and two scale parameters). A simple and fast fitting procedure is proposed. Springer-Verlag, 1990 ion implantation nationallicence depth distribution nationallicence split Student- t functions nationallicence fitting nationallicence Microchimica Acta Springer-Verlag 101/1-6(1990-01-01), 55-62 0026-3672 101:1-6<55 1990 101 604 https://doi.org/10.1007/BF01244158 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF01244158 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Gries Werner Research Institute of the Deutsche Bundespost, FTZ, P. O. Box 5000, D-6100, Darmstadt, Federal Republic of Germany aut NATIONALLICENCE 773 0- Microchimica Acta Springer-Verlag 101/1-6(1990-01-01), 55-62 0026-3672 101:1-6<55 1990 101 604 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer