caa a22 4500 467995818 CHVBK 20180323112557.0 cr unu---uuuuu 170328e19900101xx s 000 0 eng 10.1007/BF01244171 doi (NATIONALLICENCE)springer-10.1007/BF01244171 In-depth compositional analysis of ceramic (Bi2O3)0.75(Er2O3)0.25 by AES and XPS [Elektronische Daten] [Lambertus Hanekamp, Albert van den Berg, Henny Bouwmeester, Antonius Sasse, Henk Kruidhof] The chemical composition of dense ceramics of erbia-stabilized δ-Bi2O3 was analyzed by Auger electron spectroscopy (AES) depth profiling using Ar+ ion sputtering. The relative sensitivity factors (rsf) and sputter rates of bismuth and erbium in this material have been determined by electron probe microanalysis (EPMA) and chemical analysis. These results, supplemented by data from angle resolved X-ray photoelectron spectroscopy (ARXPS), shows a bismuth enrichment at the surface. Evidence has been found for reduction of the bismuth-oxide at the outermost part of the surface layer. Springer-Verlag, 1990 AES nationallicence ceramic nationallicence sputtering nationallicence XPS nationallicence Hanekamp Lambertus Faculty of Applied Physics, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut van den Berg Albert Centre of Material Research, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut Bouwmeester Henny Faculty of Chemical Technology, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut Sasse Antonius Foundation of Advanced Metals Science, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut Kruidhof Henk Faculty of Chemical Technology, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut Microchimica Acta Springer-Verlag 101/1-6(1990-01-01), 189-194 0026-3672 101:1-6<189 1990 101 604 https://doi.org/10.1007/BF01244171 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF01244171 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Hanekamp Lambertus Faculty of Applied Physics, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut NATIONALLICENCE 700 1- van den Berg Albert Centre of Material Research, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut NATIONALLICENCE 700 1- Bouwmeester Henny Faculty of Chemical Technology, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut NATIONALLICENCE 700 1- Sasse Antonius Foundation of Advanced Metals Science, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut NATIONALLICENCE 700 1- Kruidhof Henk Faculty of Chemical Technology, University Twente, P. O. Box 217, NL-7500, AE Enschede, The Netherlands aut NATIONALLICENCE 773 0- Microchimica Acta Springer-Verlag 101/1-6(1990-01-01), 189-194 0026-3672 101:1-6<189 1990 101 604 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer