caa a22 4500 46903968X CHVBK 20180323132807.0 cr unu---uuuuu 170328e19920201xx s 000 0 eng 10.1007/BF00159829 doi (NATIONALLICENCE)springer-10.1007/BF00159829 Counter-based compaction: An analysis for BIST [Elektronische Daten] [Slawomir Pilarski, Kevin Wiebe] According to some recently published results, counter-based compaction outperforms compaction by linear feedback shift registers. These results, however, are based on oversimplified assumptions. In this paper, we discuss an error model to describe the behavior of a faulty circuit under test. We study the three most popular counter-based compaction schemes, (i.e., one's counting, transition counting and edge counting). Using Markov processes we derive equations for iterative computations of exact aliasing probability for any test session length and determine the asymptotic probability of aliasing. For one's counting, we also present a closed form expression that, for any test session length, gives the exact aliasing probability. Finally, we present some examples to compare the aliasing in the counter-based compaction and compaction by a linear feedback shift register. These examples indicate that aliasing by LFSRs is more "predictable” than aliasing by counters. Kluwer Academic Publishers, 1992 Aliasing probability nationallicence built-in self-test nationallicence compaction by counter nationallicence edge counting nationallicence linear feedback shift register nationallicence one's counting nationallicence signature analysis nationallicence test response compaction nationallicence transition counting nationallicence Pilarski Slawomir School of Computing Science, Simon Fraser University, V5A 1S6, Burnaby, B.C., Canada aut Wiebe Kevin School of Computing Science, Simon Fraser University, V5A 1S6, Burnaby, B.C., Canada aut Journal of Electronic Testing Kluwer Academic Publishers 3/1(1992-02-01), 33-43 0923-8174 3:1<33 1992 3 10836 https://doi.org/10.1007/BF00159829 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00159829 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Pilarski Slawomir School of Computing Science, Simon Fraser University, V5A 1S6, Burnaby, B.C., Canada aut NATIONALLICENCE 700 1- Wiebe Kevin School of Computing Science, Simon Fraser University, V5A 1S6, Burnaby, B.C., Canada aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/1(1992-02-01), 33-43 0923-8174 3:1<33 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer