caa a22 4500 469039698 CHVBK 20180323132807.0 cr unu---uuuuu 170328e19920201xx s 000 0 eng 10.1007/BF00159831 doi (NATIONALLICENCE)springer-10.1007/BF00159831 The OR- k method for on-line checking of programmable logic arrays [Elektronische Daten] [D. Marcynuk, D. Miller] A programmable logic array (PLA) is nonconcurrent if every input pattern selects exactly one product term. We relax this requirement to limited concurrency where all product terms selected by the same input pattern must have identical output parts. A new testing method, OR-k testability, is developed for the on-line (concurrent) checking of limited concurrency PLAs. OR-k testing detects errors due to the selection of one or more extra product terms, and a conventional two-rail parity check on the outputs detects the other errors from single stuck-at, bridging, cross-point and broken line faults. The output patterns of an OR-k testable PLA must be unordered. For such PLAs, certain subsets of the outputs take on an all 1's pattern only in the presence of an extra product term error condition. A limited concurrency PLA tested by OR-k testability is strongly fault secure. Kluwer Academic Publishers, 1992 concurrency nationallicence fault secure design nationallicence on-line checking nationallicence programmable logic array nationallicence Marcynuk D. Department of Computer Science, University of Manitoba, R3T 2N2, Winnipeg, MB, Canada aut Miller D. Department of Computer Science, University of Victoria, V8W 3P6, Victoria, B.C., Canada aut Journal of Electronic Testing Kluwer Academic Publishers 3/1(1992-02-01), 53-65 0923-8174 3:1<53 1992 3 10836 https://doi.org/10.1007/BF00159831 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00159831 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Marcynuk D. Department of Computer Science, University of Manitoba, R3T 2N2, Winnipeg, MB, Canada aut NATIONALLICENCE 700 1- Miller D. Department of Computer Science, University of Victoria, V8W 3P6, Victoria, B.C., Canada aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/1(1992-02-01), 53-65 0923-8174 3:1<53 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer