caa a22 4500 469039728 CHVBK 20180323132807.0 cr unu---uuuuu 170328e19920201xx s 000 0 eng 10.1007/BF00159832 doi (NATIONALLICENCE)springer-10.1007/BF00159832 MT-SIM a mixed-level transition fault simulator based on parallel patterns [Elektronische Daten] [Chung Lee, Ching Wu, Wen Shen, Tyh Hwang, Shueng Hwang] This paper describes a mixed level, (i.e., switch-level and gate-level) transition fault simulator based on parallel patterns: MT-SIM. The switch-level allows the simulator to treat faults at the transistor level, while the gate-level conserves the simulation speed and the parallel pattern strategy further enhances the simulation speed for more than one order of magnitude. The simulator is built based on a set of operators which translate the switch-level signal propagation into Boolean operations and transform the gate-level logic elements into symbolic logic representations. The experimental results of the simulator show that it can exhibit a linear performance for the logic-level simulation if a longer word length is adopted. Kluwer Academic Publishers, 1992 Fault simulation nationallicence mixed-level nationallicence parallel pattern nationallicence transition fault nationallicence Lee Chung Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C. aut Wu Ching Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C. aut Shen Wen Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C. aut Hwang Tyh Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C. aut Hwang Shueng Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C. aut Journal of Electronic Testing Kluwer Academic Publishers 3/1(1992-02-01), 67-78 0923-8174 3:1<67 1992 3 10836 https://doi.org/10.1007/BF00159832 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00159832 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Lee Chung Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C aut NATIONALLICENCE 700 1- Wu Ching Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C aut NATIONALLICENCE 700 1- Shen Wen Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C aut NATIONALLICENCE 700 1- Hwang Tyh Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C aut NATIONALLICENCE 700 1- Hwang Shueng Department of Electronics, National Chiao Tung University, Hsin-Chu, Taiwan, R.O.C aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/1(1992-02-01), 67-78 0923-8174 3:1<67 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer