caa a22 4500 469039760 CHVBK 20180323132807.0 cr unu---uuuuu 170328e19920801xx s 000 0 eng 10.1007/BF00134734 doi (NATIONALLICENCE)springer-10.1007/BF00134734 Near-optimal tests for classes of write-triggered coupling faults in RAMs [Elektronische Daten] [B. Cockburn, J. Brzozowski] This article is concerned with the detection of write-triggered coupling faults and toggling faults (certain double coupling faults) in n × 1 random-access memories (RAMs), where n is the number of one-bit words in the memory. In an earlier article we showed that any functional test that detects all multiple coupling faults must have a length of at least 2n 2 + 3n. Since such a test is prohibitively long, given modern RAM capacities, we study more manageable subclasses of the class of all coupling faults. We show that there exist two hierarchies of fault models corresponding to nested subclasses of toggling faults and coupling faults, respectively, of increasing maximum multiplicities. We then identify optimal or near-optimal tests for two classes of toggling faults and five classes of coupling faults; these tests are of order n or nlog2 n. Kluwer Academic Publishers, 1992 RAM testing nationallicence coupling faults nationallicence toggling faults nationallicence lower bounds nationallicence optimal tests nationallicence Cockburn B. Department of Electrical Engineering, University of Alberta, T6G 2G7, Edmonton, Alberta, Canada aut Brzozowski J. Department of Computer Science, University of Waterloo, N2L 3G1, Waterloo, Ontario, Canada aut Journal of Electronic Testing Kluwer Academic Publishers 3/3(1992-08-01), 251-264 0923-8174 3:3<251 1992 3 10836 https://doi.org/10.1007/BF00134734 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00134734 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Cockburn B. Department of Electrical Engineering, University of Alberta, T6G 2G7, Edmonton, Alberta, Canada aut NATIONALLICENCE 700 1- Brzozowski J. Department of Computer Science, University of Waterloo, N2L 3G1, Waterloo, Ontario, Canada aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/3(1992-08-01), 251-264 0923-8174 3:3<251 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer