caa a22 4500 469039779 CHVBK 20180323132807.0 cr unu---uuuuu 170328e19920801xx s 000 0 eng 10.1007/BF00134731 doi (NATIONALLICENCE)springer-10.1007/BF00134731 Testability analysis and fault modeling of BiCMOS circuits [Elektronische Daten] [D. Al-Khalili, C. Rozon, B. Stewart] Defect models have been used for testability analysis of BiCMOS circuits and the results have been compared with an analysis of CMOS circuits. Using a nominal point approach, faults generated are classified as logical or performance degradation faults. It is found that logical fault testing can only cover a small percentage of the total fault set, 54% for BiCMOS, versus 69% for equivalent CMOS gates. Delay faults and current faults are analyzed as applied to BiCMOS and CMOS gates. It is shown that logical fault testing in conjunction with either delay fault testing or current fault testing promises the highest fault coverage for BiCMOS logic gates, around 95%. Kluwer Academic Publishers, 1992 BiCMOS nationallicence defects nationallicence faults nationallicence modeling nationallicence testability nationallicence Al-Khalili D. Department of Electrical and Computer Engineering, Royal Military College of Canada, K7K 5L0, Kingston, Ontario, Canada aut Rozon C. Department of Electrical and Computer Engineering, Royal Military College of Canada, K7K 5L0, Kingston, Ontario, Canada aut Stewart B. Department of Electrical and Computer Engineering, Royal Military College of Canada, K7K 5L0, Kingston, Ontario, Canada aut Journal of Electronic Testing Kluwer Academic Publishers 3/3(1992-08-01), 207-217 0923-8174 3:3<207 1992 3 10836 https://doi.org/10.1007/BF00134731 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00134731 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Al-Khalili D. Department of Electrical and Computer Engineering, Royal Military College of Canada, K7K 5L0, Kingston, Ontario, Canada aut NATIONALLICENCE 700 1- Rozon C. Department of Electrical and Computer Engineering, Royal Military College of Canada, K7K 5L0, Kingston, Ontario, Canada aut NATIONALLICENCE 700 1- Stewart B. Department of Electrical and Computer Engineering, Royal Military College of Canada, K7K 5L0, Kingston, Ontario, Canada aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/3(1992-08-01), 207-217 0923-8174 3:3<207 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer