caa a22 4500 469039817 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19920801xx s 000 0 eng 10.1007/BF00134729 doi (NATIONALLICENCE)springer-10.1007/BF00134729 A decomposition approach for testing large analog networks [Elektronische Daten] [Janusz Starzyk, Hong Dai] This article presents an efficient method for testing large scale analog and mixed mode networks. Test equations are derived for a partitioned network from Krichhoff current law equations at the partition points. Voltages at the partition points are used to identify network parameters. The method has applications to circuit modeling, fault diagnosis, testing and calibration. The conventional testing methods for dynamic, nonlinear networks are based on the sensitivity approach, which uses incremental changes in voltages to estimate changes in network parameters. However, this conventional approach cannot handle large scale circuits because the sensitivity matrix is dense. This results in enormous requirements for memory space and computing time when the circuit size becomes large. The new method overcomes these deficiencies of the sensitivity approach. In this article, we introduce the decomposition method, describe its basic features and its algorithm, and compare this method with a conventional, sensitivity technique using testing network examples. Kluwer Academic Publishers, 1992 Analog testing nationallicence circuit decomposition nationallicence large system identification nationallicence test programming nationallicence Starzyk Janusz Electrical and Computer Engineering Department, Ohio University, 45701, Athens, OH, USA aut Dai Hong Electrical Engineering Department, Lafayette College, 18042, Easton, PA, USA aut Journal of Electronic Testing Kluwer Academic Publishers 3/3(1992-08-01), 181-195 0923-8174 3:3<181 1992 3 10836 https://doi.org/10.1007/BF00134729 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00134729 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Starzyk Janusz Electrical and Computer Engineering Department, Ohio University, 45701, Athens, OH, USA aut NATIONALLICENCE 700 1- Dai Hong Electrical Engineering Department, Lafayette College, 18042, Easton, PA, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/3(1992-08-01), 181-195 0923-8174 3:3<181 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer