caa a22 4500 469039825 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19920801xx s 000 0 eng 10.1007/BF00134735 doi (NATIONALLICENCE)springer-10.1007/BF00134735 Testing of static random access memories by monitoring dynamic power supply current [Elektronische Daten] [Shyang-Tai Su, Rafic Makki] This article presents a correlation between dynamic power supply current and pattern sensitive faults in SRAMs. It is shown that the dynamic power supply current provides a window for observing the internal switching behavior of the memory cells. Switching of the logic state of a memory cell results in a transient current pulse in the power supply rails. A new current-testable SRAM structure is presented which can be used to isolate normal current transients from those resulting from pattern sensitivity. The new structure differs from traditional SRAM structures only in the way that power is distributed to the cells. The new structure allows for very high coverages of disturb-type pattern sensitivity using a simple algorithm of length 5n where n is the number of cells. Kluwer Academic Publishers, 1992 Current-testable design nationallicence dynamic current monitors nationallicence dynamic power supply current nationallicence fault modeling nationallicence pattern sensitivity nationallicence Su Shyang-Tai Department of Electrical Engineering, University of North Carolina at Charlotte, 28223, Charlotte, NC, USA aut Makki Rafic Department of Electrical Engineering, University of North Carolina at Charlotte, 28223, Charlotte, NC, USA aut Journal of Electronic Testing Kluwer Academic Publishers 3/3(1992-08-01), 265-278 0923-8174 3:3<265 1992 3 10836 https://doi.org/10.1007/BF00134735 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00134735 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Su Shyang-Tai Department of Electrical Engineering, University of North Carolina at Charlotte, 28223, Charlotte, NC, USA aut NATIONALLICENCE 700 1- Makki Rafic Department of Electrical Engineering, University of North Carolina at Charlotte, 28223, Charlotte, NC, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/3(1992-08-01), 265-278 0923-8174 3:3<265 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer