caa a22 4500 469039884 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19921201xx s 000 0 eng 10.1007/BF00135341 doi (NATIONALLICENCE)springer-10.1007/BF00135341 Algorithms for I DDQ measurement based diagnosis of bridging faults [Elektronische Daten] [Sreejit Chakravarty, Minsheng Liu] In the absence of information about the layout one is left with no alternative but to consider all bridging faults. An algorithm for diagnosis of a subset of such faults, viz. single two line bridging faults in static CMOS combinational circuits is presented. This algorithm uses results from I DDQ measurement based testing. Unlike known diagnosis algorithms, this algorithm does not use fault dictionaries, it uses only logic simulation and uses no fault simulation. It also uses SOPS, a novel representation of subsets of two-line bridging faults resulting in an efficient algorithm. In spite of the large number of faults that we consider, our experimental results point to the computational feasibility of I DDQ Measurement based diagnosis of single two line bridging faults. It also shows the effectiveness of reducing the set of possible faults using I DDQ measurements. Kluwer Academic Publishers, 1992 Bridging faults nationallicence diagnosis algorithm nationallicence I DDQ testing nationallicence Chakravarty Sreejit Dept. of Computer Science, State University of New York, 14260, Buffalo, NY, USA aut Liu Minsheng Performance Technologies, Inc., 315 Science Parkway, 14620, Rochester, NY, USA aut Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 377-385 0923-8174 3:4<377 1992 3 10836 https://doi.org/10.1007/BF00135341 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00135341 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Chakravarty Sreejit Dept. of Computer Science, State University of New York, 14260, Buffalo, NY, USA aut NATIONALLICENCE 700 1- Liu Minsheng Performance Technologies, Inc., 315 Science Parkway, 14620, Rochester, NY, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 377-385 0923-8174 3:4<377 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer