caa a22 4500 469039892 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19921201xx s 000 0 eng 10.1007/BF00135335 doi (NATIONALLICENCE)springer-10.1007/BF00135335 Perry Roger Storage Technology Corporation, 2270 South 88th Street, 80028-5110, Louisville, CO, USA aut I DDQ testing in CMOS digital ASICs [Elektronische Daten] [Roger Perry] I DDQ testing with precision measurement unit (PMU) was used to eliminate early life failures caused by CMOS digital ASICs in our products. Failure analysis of the rejected parts found that bridging faults caused by particles were not detected in incoming tests created by automatic test generation (ATG) for stuck-at-faults (SAF). The nominal 99.6% SAF test coverage required to release a design for production was not enough! This article shows how I DDQ testing and supplier process improvements affected our early life failure rates over a three year period. A typical I DDQ measurement distribution, effects of multiple I DDQ testing, and examples of the defects found are presented. The effects of less than 99.6% fault coverage after the I DDQ testing was implemented are reviewed. The methods used to establish I DDQ test limits and implement the I DDQ test with existing ATG testing are included. This article is a revision of one given at International Test Conference [1]. Kluwer Academic Publishers, 1992 Automatic test program generation nationallicence bridging fault nationallicence early life failures nationallicence I DDQ current nationallicence stuck-at fault nationallicence Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 317-325 0923-8174 3:4<317 1992 3 10836 https://doi.org/10.1007/BF00135335 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00135335 text/html Onlinezugriff via DOI NATIONALLICENCE 100 1- Perry Roger Storage Technology Corporation, 2270 South 88th Street, 80028-5110, Louisville, CO, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 317-325 0923-8174 3:4<317 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer