caa a22 4500 469039922 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19921201xx s 000 0 eng 10.1007/BF00135339 doi (NATIONALLICENCE)springer-10.1007/BF00135339 Generation and evaluation of current and logic tests for switch-level sequential circuits [Elektronische Daten] [Chun-Hung Chen, Jacob Abraham] This article presents an approach to developing high quality tests for switch-level circuits using both current and logic test generation algorithms. Faults that are aborted or undetectable by logic tests may be detected by current tests, or vice versa. An efficient switch level test generation algorithm for generating current and logic tests is introduced. Clear definitions for analyzing the effectiveness of the joint test generation approach are derived. Experimental results are presented for demonstrating high coverage of stuck-at, stuck-on, and stuck-open faults for switch level circuits when both current and logic tests are used. Kluwer Academic Publishers, 1992 Current tests nationallicence I DDQ nationallicence logic tests nationallicence test generation nationallicence Chen Chun-Hung Computer Engineering Research Center, The University of Texas at Austin, 2201 Donley Dr., Ste. 395, 78758, Austin, TX, USA aut Abraham Jacob Computer Engineering Research Center, The University of Texas at Austin, 2201 Donley Dr., Ste. 395, 78758, Austin, TX, USA aut Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 359-366 0923-8174 3:4<359 1992 3 10836 https://doi.org/10.1007/BF00135339 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00135339 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Chen Chun-Hung Computer Engineering Research Center, The University of Texas at Austin, 2201 Donley Dr., Ste. 395, 78758, Austin, TX, USA aut NATIONALLICENCE 700 1- Abraham Jacob Computer Engineering Research Center, The University of Texas at Austin, 2201 Donley Dr., Ste. 395, 78758, Austin, TX, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 359-366 0923-8174 3:4<359 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer