caa a22 4500 469039930 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19921201xx s 000 0 eng 10.1007/BF00135333 doi (NATIONALLICENCE)springer-10.1007/BF00135333 I DDQ testing: A review [Elektronische Daten] [Jerry Soden, Charles Hawkins, Ravi Gulati, Weiwei Mao] Quiescent power supply current (I DDQ ) testing of CMOS integrated circuits is a technique for production quality and reliability improvement, design validation, and failure analysis. It has been used for many years by a few companies and is now receiving wider acceptance as an industry tool. This article begins with a brief history of CMOS ICs to provide perspective on the origin of I DDQ testing. Next, the use of I DDQ testing for IC quality improvement through increased defect and fault detection is described. Then implementation issues are considered, including test pattern generation software, hardware instrumentation, limit setting, IC design guidelines, and defect diagnosis. An extended reference list is provided to help the reader obtain more information on specific aspects. Kluwer Academic Publishers, 1992 CMOS IC nationallicence I DDQ nationallicence Current testing nationallicence IC quality nationallicence defects nationallicence fault models nationallicence Soden Jerry Department 2275, Sandia National Laboratories, PO Box 5800, 87185-5800, Albuquerque, NM, USA aut Hawkins Charles Electrical and Computer Engr. Dept., The University of New Mexico, 87131, Albuquerque, NM, USA aut Gulati Ravi Ford Microelectronics, Inc., 9965 Federal Drive, 80921-3698, Colorado Springs, CO, USA aut Mao Weiwei Ford Microelectronics, Inc., 9965 Federal Drive, 80921-3698, Colorado Springs, CO, USA aut Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 291-303 0923-8174 3:4<291 1992 3 10836 https://doi.org/10.1007/BF00135333 text/html Onlinezugriff via DOI 1 review-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00135333 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Soden Jerry Department 2275, Sandia National Laboratories, PO Box 5800, 87185-5800, Albuquerque, NM, USA aut NATIONALLICENCE 700 1- Hawkins Charles Electrical and Computer Engr. Dept., The University of New Mexico, 87131, Albuquerque, NM, USA aut NATIONALLICENCE 700 1- Gulati Ravi Ford Microelectronics, Inc., 9965 Federal Drive, 80921-3698, Colorado Springs, CO, USA aut NATIONALLICENCE 700 1- Mao Weiwei Ford Microelectronics, Inc., 9965 Federal Drive, 80921-3698, Colorado Springs, CO, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 291-303 0923-8174 3:4<291 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer