caa a22 4500 469039949 CHVBK 20180323132808.0 cr unu---uuuuu 170328e19921201xx s 000 0 eng 10.1007/BF00135334 doi (NATIONALLICENCE)springer-10.1007/BF00135334 I DDQ testing as a component of a test suite: The need for several fault coverage metrics [Elektronische Daten] [Peter Maxwell, Robert Aitken] This article is concerned with the role of I DDQ testing, in conjunction with other types of tests, in achieving high quality. In particular, the argument is made that rather than use a single fault coverage, it is better to obtain a number of different coverages, for different types of faults. To demonstrate the need for increasingly stringent fault coverage requirements, an analysis is given of the relationship between quality, fault coverage and chip area. This analysis shows that as chip area increases, fault coverage must also increase to maintain constant quality levels. Data are then presented from a production part tested with I DDQ , scan, timing and functional tests. To realistically fault grade I DDQ tests, three different coverage metrics are considered. The data show differences in tester failures compared to these coverage metrics, depending on whether one uses total I DDQ failures (parts which fail I DDQ regardless of whether they fail other tests as well) or unique I DDQ failures (parts which fail only I DDQ ). The relative effectiveness of the different components of the full test suite are analyzed and it is demonstrated that no component can be removed without suffering a reduction in quality. Kluwer Academic Publishers, 1992 Current testing nationallicence fault coverage nationallicence functional testing nationallicence physical defects nationallicence quality nationallicence scan nationallicence Maxwell Peter Design Technology Center, Hewlett-Packard Company, 95052, Santa Clara, CA, USA aut Aitken Robert Design Technology Center, Hewlett-Packard Company, 95052, Santa Clara, CA, USA aut Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 305-316 0923-8174 3:4<305 1992 3 10836 https://doi.org/10.1007/BF00135334 text/html Onlinezugriff via DOI 1 research-article jats NATIONALLICENCE 856 40 https://doi.org/10.1007/BF00135334 text/html Onlinezugriff via DOI NATIONALLICENCE 700 1- Maxwell Peter Design Technology Center, Hewlett-Packard Company, 95052, Santa Clara, CA, USA aut NATIONALLICENCE 700 1- Aitken Robert Design Technology Center, Hewlett-Packard Company, 95052, Santa Clara, CA, USA aut NATIONALLICENCE 773 0- Journal of Electronic Testing Kluwer Academic Publishers 3/4(1992-12-01), 305-316 0923-8174 3:4<305 1992 3 10836 Metadata rights reserved Springer special CC-BY-NC licence nationallicence BK010053 XK010053 XK010000 NATIONALLICENCE NATIONALLICENCE NL-springer